1.

Conference Proceedings

Conference Proceedings
Herron,J.N. ; zumBrunnen,S. ; Wang,J. ; Gao,X. ; Wang,H. ; Terry,A.H. ; Christensen,D.A.
Pub. info.: In-vitro diagnostic instrumentation : 26-27 January 2000, San Jose, California.  pp.177-184,  2000.  Bellingham, Washington.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3913
2.

Conference Proceedings

Conference Proceedings
Wang,J. ; Niino,H. ; Yabe,A.
Pub. info.: Laser applications in microelectronic and optoelectronic manufacturing V : 24-26 January 2000, San Jose, USA.  pp.347-354,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3933
3.

Conference Proceedings

Conference Proceedings
Zhou,Y.-H. ; Wang,J. ; Jiang,Q.
Pub. info.: Smart structures and materials 2000 : mathematics and control in smart structures : 6-9 March, 2000, Newport Beach, USA.  pp.553-561,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3984
4.

Conference Proceedings

Conference Proceedings
Lee,C.-H. ; Lin,W.-J. ; Wang,J.
Pub. info.: Optical sensing, imaging, and manipulation for biological and biomedical applications : 26-28 July 2000, Taipei, Taiwan.  pp.125-133,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4082
5.

Conference Proceedings

Conference Proceedings
Gao,J. ; Ye,K. ; Wang,J. ; Chen,H. ; Jiang,P. ; Zhang,C.
Pub. info.: Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China.  pp.243-247,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4221
6.

Conference Proceedings

Conference Proceedings
Wang,J. ; Hu,Z. ; Liu,Y. ; Liang,J.
Pub. info.: Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China.  pp.10-14,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4221
7.

Conference Proceedings

Conference Proceedings
Ren,M. ; Shi,Y. ; Wang,J. ; Yuan,W.
Pub. info.: Biomedical photonics and optoelectronic imaging : 8-10 November 2000, Beijing, China.  pp.91-95,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4224
8.

Conference Proceedings

Conference Proceedings
Li,W. ; Yu,D. ; Wang,J. ; Deng,L. ; Xie,H. ; Jiang,J.
Pub. info.: Biomedical photonics and optoelectronic imaging : 8-10 November 2000, Beijing, China.  pp.55-59,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4224
9.

Conference Proceedings

Conference Proceedings
Mao,H. ; Wang,Q. ; Wang,J. ; Li,F. ; Cheng,D.
Pub. info.: Biomedical photonics and optoelectronic imaging : 8-10 November 2000, Beijing, China.  pp.87-90,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4224
10.

Conference Proceedings

Conference Proceedings
Lu,J. ; Lai,Z. ; Wei,J. ; Zhang,H. ; Deng,Z. ; Zhang,Q. ; Wang,J.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.835-838,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086