1.

Conference Proceedings

Conference Proceedings
Kamimura,T. ; Ono,R. ; Yap,Y.K. ; Yoshimura,M. ; Mori,Y. ; Sasaki,T. ; Tsuru,T. ; Ogawa,T. ; Yoshida,H. ; Nakatsuka,M. ; Yoshida,K.
Pub. info.: Laser-induced damage in optical materials, 2000 : 32nd Annual Boulder Damage Symposium, proceedings, 16-18, October, 2000, Boulder, Colorado.  pp.454-455,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4347
2.

Conference Proceedings

Conference Proceedings
Sano,T. ; Suzuki,M. ; Ogawa,T. ; Shibasaki,K. ; Kuze,A. ; Kawashima,T.
Pub. info.: Optical remote sensing of the atmosphere and clouds II : 9-12 October 2000, Sendai, Japan.  pp.365-372,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4150
3.

Conference Proceedings

Conference Proceedings
Kuze,A. ; Kawashima,T. ; Yamamoto,Y. ; Shibasaki,K. ; Suzuki,M. ; Sano,T. ; Ogawa,T.
Pub. info.: Optical remote sensing of the atmosphere and clouds II : 9-12 October 2000, Sendai, Japan.  pp.373-382,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4150
4.

Conference Proceedings

Conference Proceedings
Kawashima,T. ; Kuze,A. ; Tanii,J. ; Mori,S. ; Ogawa,T. ; Suzuki,M. ; Shibasaki,K. ; Yamamoto,Y. ; Sano,T.
Pub. info.: Optical remote sensing of the atmosphere and clouds II : 9-12 October 2000, Sendai, Japan.  pp.400-409,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4150
5.

Conference Proceedings

Conference Proceedings
Shibasaki,K. ; Suzuki,M. ; Sano,T. ; Ogawa,T.
Pub. info.: Optical remote sensing of the atmosphere and clouds II : 9-12 October 2000, Sendai, Japan.  pp.160-164,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4150
6.

Conference Proceedings

Conference Proceedings
Suzuki,M. ; Shibasaki,K. ; Sano,T. ; Ishida,C. ; Shimoda,H. ; Ogawa,T.
Pub. info.: Optical remote sensing of the atmosphere and clouds II : 9-12 October 2000, Sendai, Japan.  pp.148-159,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4150
7.

Conference Proceedings

Conference Proceedings
Su,W. ; Suzuki,M. ; Nakamura,R. ; Ogawa,T.
Pub. info.: Optical remote sensing of the atmosphere and clouds II : 9-12 October 2000, Sendai, Japan.  pp.87-93,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4150
8.

Conference Proceedings

Conference Proceedings
Matsuo,T. ; Ogawa,T. ; Morimoto,H.
Pub. info.: Optical microlithography XIII : 1-3 March 2000, Santa Clara, USA.  Part1  pp.443-451,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4000
9.

Conference Proceedings

Conference Proceedings
Hoshino,E. ; Ogawa,T. ; Takahashi,M. ; Hoko,H. ; Yamanashi,H. ; Hirano,N. ; Chiba,A. ; Lee,B.-T. ; Ito,M. ; Okazaki,S.
Pub. info.: 17th European Conference on Mask Technology for Integrated Circuits and Microcomponents.  pp.13-17,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4349
10.

Conference Proceedings

Conference Proceedings
Suzuki,M. ; Shimoda,H. ; Kobayashi,H. ; Ogawa,T.
Pub. info.: Infrared spaceborne remote sensing VIII : 31 July - 1 August 2000, San Diego, USA.  pp.297-304,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4131