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16 results

Conference Proceedings

1. Analysis of position error signal in out-radial optical pickup systems

Xu,B. ; Chong,T.C. ; Liu,M.Y. ; Yuan,G. ; Lu,Y.

Pub. info.:	Fifth International Symposium on Optical Storage (ISOS 2000) : 22-26 May 2000, Shanghai, China. pp.233-236, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4085

Conference Proceedings

2. Numerical simulation of electromagnetic propagation in high-data-density near-field optical recording

Liu,K. ; Ming,H. ; Lu,Y. ; Bai,M. ; Xie,J.

Pub. info.:	Fifth International Symposium on Optical Storage (ISOS 2000) : 22-26 May 2000, Shanghai, China. pp.220-223, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4085

Conference Proceedings

3. Deformation measurement of high-power laser resonator mirrors using 2D shearing interferometer

Fu,L. ; Shi,H. ; Ni,S. ; Lu,Y. ; Zhang,L. ; Xin,J.

Pub. info.:	Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China. pp.15-18, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4223

Conference Proceedings

4. Surface emitter in near UV: study on metallic film

DuanMu,Q. ; Tian,J. ; Li,Y. ; Jiang,D. ; Lu,Y. ; Fu,L.

Pub. info.:	Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.327-329, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4086

Conference Proceedings

5. Embedded image coding based on novel organization of DCT coefficients

Zhao,D. ; Chan,Y.K. ; Lu,Y.

Pub. info.:	Applications of digital image processing XXIII : 31 July - 3 August 2000, San Diego, USA. pp.153-162, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4115

Conference Proceedings

6. Free-space optical interconnect system using polarization-rotating modulator arrays

McCarthy,A. ; Tooley,F.A.P. ; Laprise,E. ; Plant,D.V. ; Kirk,A.G. ; Oren,M. ; Lu,Y.

Pub. info.:	Optics in computing 2000 : 18-23 June 2000, Quebec city, Canada. pp.272-277, 2000. Bellingham, WA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4089

Conference Proceedings

7. Heteroepitaxial growth of transition metal oxides using UHV laser molecular beam epitaxy

Gross,R. ; Klein,J. ; Wiedenhorst,B. ; Hofener,C. ; Schoop,U. ; Philipp,J.B. ; Schonecke,M. ; Herbstritt,F. ; Alff,L. ; Lu,Y. ; Marx,A. ; Schymon,S. ; Thienhaus,S. ; Mader,W.

Pub. info.:	Superconducting and related oxides, physics and nanoengineering IV : 24-28 April 2000, Orlando, USA. pp.278-294, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4058

Conference Proceedings

8. Correlation between the low-frequency electrical noise of high-power quantum well lasers and device quality

Hu,G. ; Shi,J. ; Zhang,S. ; Lu,Y. ; Qi,L. ; Li,H. ; Zhang,F.

Pub. info.:	Advanced photonic sensors : Technology and applications, 8-10 Novenber 2000, Beijing, China. pp.217-220, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4220

Conference Proceedings

9. Thermal deformation measurement of electronic packaging component using AFM scanning moire method

Hie,H. ; Chai,G.B. ; Asundi,A.K. ; Jin,Y. ; Lu,Y. ; Ngoi,B.K.A. ; Zhong,Z.

Pub. info.:	Second International Conference on Experimental Mechanics : 29 November-1 December 2000, Singapore. pp.180-185, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4317

10.

Conference Proceedings

10. New way of preparing ion barrier ultrathin film without pollution

DuanMu,Q. ; Jiang,D. ; Lu,Y. ; Li,Y. ; Fu,L. ; Tian,J.

Pub. info.:	Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.443-445, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4086

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