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37 results

Conference Proceedings

1. Hierarchical neural networks for pixel classification

Schouten,T.E. ; Liu,Z. ; Feng,L. ; Junjie,G.

Pub. info.:	Image and signal processing for remote sensing VI : 27-29 September 2000, Barcelona, Spain. pp.57-64, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4170

Conference Proceedings

2. Morphological filter and it's applications in TV tracker

Zhu,Z. ; Liu,Z. ; Liang,H. ; Song,B. ; Pan,A.

Pub. info.:	Image and signal processing for remote sensing VI : 27-29 September 2000, Barcelona, Spain. pp.265-271, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4170

Conference Proceedings

3. Small target detection in multisensor system based on Dempster-Shafer evidence theory

Liang,H. ; Zhu,Z. ; Xu,G. ; Liu,Z. ; Ni,G.

Pub. info.:	Image and signal processing for remote sensing VI : 27-29 September 2000, Barcelona, Spain. pp.272-279, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4170

Conference Proceedings

4. Geometry-compensated scintillator for low-yield ICF burn history measurements

Yang,J. ; Wen,S. ; Wang,G. ; Liu,Z. ; Yang,H. ; Tang,Z.

Pub. info.:	ECLIM 2000 : 26th European Conference on Laser Interaction with Matter, 12-16 June, 2000, Prague, Czech Republic. pp.190-193, 2000. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4424

Conference Proceedings

5. Neutron time-of-flight ion temperature measurement of direct-drive implosions on SG-？ laser facility

Yang,J. ; Wen,S. ; Tang,Z. ; Guo,Ｙ. ; Ｗａｎｇ,Ｇ. ; Ｙａｎｇ,Ｈ. ; Zheng,Z. ; Liu,Z.

Pub. info.:	ECLIM 2000 : 26th European Conference on Laser Interaction with Matter, 12-16 June, 2000, Prague, Czech Republic. pp.194-196, 2000. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4424

Conference Proceedings

6. Fabrication of large-aperture random phase plate for uniform illumination on laser fusion target

Huang,H. ; Lu,D. ; Wang,R. ; Zhao,Y. ; Liu,Z.

Pub. info.:	Advanced high-power lasers : 1-5 November 1999, Osaka, Japan. pp.836-841, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3889

Conference Proceedings

7. Method of measuring electricoptical parameters for LCD modules

Liu,Z.

Pub. info.:	Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China. pp.186-188, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4223

Conference Proceedings

8. Valid methods for improving reliability of the MPU-controlled YAG laser

Liu,Z. ; Zhu,D. ; Guo,W.

Pub. info.:	Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China. pp.165-168, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4223

Conference Proceedings

9. Photoelectric soft x-ray multilayer coating thickness control system

Ming,X. ; Chen,B. ; Liu,Z.

Pub. info.:	Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China. pp.114-117, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4223

10.

Conference Proceedings

10. Detecting and evaluating the viewing-angle characteristic for LCDs at different conditions

Liu,Z.

Pub. info.:	Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China. pp.183-185, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4223

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