1.

Conference Proceedings

Conference Proceedings
Chu,G. ; Liu,X. ; Liu,Y. ; Wu,D. ; Wang,L.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.765-768,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
2.

Conference Proceedings

Conference Proceedings
Chu,G. ; Liu,X. ; Wu,D. ; Liu,Y. ; Zhao,J. ; Wang,L.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.769-772,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
3.

Conference Proceedings

Conference Proceedings
Pan,Y. ; Ning,Y. ; Suo,H. ; Liu,Y. ; Wang,L. ; Lin,J. ; Wu,D. ; Li,S.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.244-247,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
4.

Conference Proceedings

Conference Proceedings
Liu,Y. ; Wang,L. ; Yuan,W.
Pub. info.: Hyperspectral remote sensing of the land and atomosphere : 9-12 October 2000, Sendai, Japan.  pp.246-255,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4151
5.

Conference Proceedings

Conference Proceedings
Wang,Y. ; Wang,L. ; Hou,P. ; Hu,C. ; Liu,Y.
Pub. info.: Advanced photonic sensors : Technology and applications, 8-10 Novenber 2000, Beijing, China.  pp.166-170,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4220