1.

Conference Proceedings

Conference Proceedings
Sarkisov,S.S. ; Liu,J. ; Curley,M.J. ; Banks,C.E.
Pub. info.: Optics of crystals : 26-30 September 2000, Mozyr, Belarus.  pp.153-164,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4358
2.

Conference Proceedings

Conference Proceedings
Simonis,G.J. ; Liu,J. ; Koley,B. ; Dagenais,M. ; Mait,J.N. ; Newman,P.G. ; Lawler,B. ; Chang,W.H. ; Shen,P.H. ; Taysing-Lara,M.A. ; Datta,M.
Pub. info.: Vertical-cavity surface-emitting lasers IV : 26-28 January 2000, San Jose, California.  pp.172-186,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3946
3.

Conference Proceedings

Conference Proceedings
Zhao,G. ; Liu,J. ; Tam,S.-C. ; Xie,W. ; Liu,W. ; Wen,G. ; Gong,Z. ; Gu,J. ; Lam,Y.-L.
Pub. info.: Solid state lasers IX : 25-26 January 2000, San Jose, California.  pp.229-235,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3929
4.

Conference Proceedings

Conference Proceedings
Liu,J. ; Song,H. ; Kumar,B.V.K.Vijaya ; Shieh,H.-P.D. ; Bain,J.A.
Pub. info.: Optical data storage 2000 : 14-17 May, 2000, Whistler, Canada.  pp.292-299,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4090
5.

Conference Proceedings

Conference Proceedings
Yao,J. ; Zhou,Y. ; Lam,Y.L. ; Liu,J. ; Wang,Y. ; Tjin,S.C.
Pub. info.: Applications of photonic technology 4 : closing the gap between theory, development, and application : Photonics North 2000.  pp.885-892,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4087
6.

Conference Proceedings

Conference Proceedings
He,Y. ; Yan,J. ; Li,J. ; Liu,J. ; Yu,C.
Pub. info.: Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China.  pp.19-22,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4223
7.

Conference Proceedings

Conference Proceedings
Liu,J. ; Yu,C. ; Li,J. ; Yan,J. ; Feng,B. ; Zhang,Z. ; Zhang,X.
Pub. info.: Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China.  pp.393-396,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4221
8.

Conference Proceedings

Conference Proceedings
Liu,J. ; Zhang,Y. ; Cheng,M.
Pub. info.: Optical methods for indusutrial processes : 6-7 November 2000, Boston, USA.  pp.24-32,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4201
9.

Conference Proceedings

Conference Proceedings
Yu,H. ; Song,R. ; Huo,C. ; Liu,J. ; Huang,W. ; Shi,H.
Pub. info.: Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China.  pp.224-230,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4231
10.

Conference Proceedings

Conference Proceedings
Liu,J. ; Azzam,R.M.A.
Pub. info.: Polarization analysis, measurement, and remote sensing III : 2-4 August 2000, San Diego, USA.  pp.34-43,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4133