1.

Conference Proceedings

Conference Proceedings
Gong,W. ; Li,Z. ; Xu,D.-S.
Pub. info.: Gas, chemical, and electrical lasers and intense beam control and applications : 24-25 January 2000, San Jose, California.  pp.188-192,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3931
2.

Conference Proceedings

Conference Proceedings
Wang,G. ; Raymond,G.M. ; Li,Y. ; Schweiger,G.D. ; Sharafuddin,M.J. ; Stolpen,A.H. ; Yang,S. ; Li,Z. ; Bassingthwaighte,J.B. ; Vannier,M.W.
Pub. info.: Medical imaging 2000 : physiology and function from multidimensional images, 13-15 February 2000, San Diego, California.  pp.436-447,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3978
3.

Conference Proceedings

Conference Proceedings
Yi,Y. ; Li,Z. ; Wei,S. ; Deng,F. ; Yao,S.
Pub. info.: Biomedical photonics and optoelectronic imaging : 8-10 November 2000, Beijing, China.  pp.105-108,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4224
4.

Conference Proceedings

Conference Proceedings
Wang,Z. ; Li,Z. ; He,A.
Pub. info.: Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China.  pp.257-263,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4221
5.

Conference Proceedings

Conference Proceedings
Li,Z. ; Xu,X. ; Wang,Z. ; Lai,J. ; Tao,H. ; He,A.
Pub. info.: Biomedical photonics and optoelectronic imaging : 8-10 November 2000, Beijing, China.  pp.122-130,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4224
6.

Conference Proceedings

Conference Proceedings
Li,Z. ; Fan,L. ; Qiang,X.
Pub. info.: Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China.  pp.127-130,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4223
7.

Conference Proceedings

Conference Proceedings
Yi,Y. ; Li,Z. ; Li,X. ; Deng,F.
Pub. info.: Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China.  pp.239-242,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4221
8.

Conference Proceedings

Conference Proceedings
Chen,J. ; Wang,W. ; Li,Z.
Pub. info.: Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China.  pp.189-193,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4223
9.

Conference Proceedings

Conference Proceedings
Li,Z. ; Wang,Z. ; Tang,X. ; Qiang,X.
Pub. info.: Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China.  pp.131-134,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4223
10.

Conference Proceedings

Conference Proceedings
Li,Z. ; Qiang,X. ; Wu,Z. ; Fan,C.
Pub. info.: Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China.  pp.135-139,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4223