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37 results

Conference Proceedings

1. Laser measurement for slight deformation of a large-scale structure

Yi,Y. ; Li,Z. ; Li,X. ; Deng,F.

Pub. info.:	Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China. pp.239-242, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4221

Conference Proceedings

2. Microarray imaging system for measuring the properties of a moving object

Tian,W. ; Huang,M. ; Chen,R. ; Li,X. ; Zhang,W.

Pub. info.:	Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China. pp.234-238, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4221

Conference Proceedings

3. Testing system for groove geometry of CD-R substrates

Xu,W. ; Gan,F. ; Shi,H. ; He,H. ; Lin,Q. ; Sun,J. ; Li,X.

Pub. info.:	Fifth International Symposium on Optical Storage (ISOS 2000) : 22-26 May 2000, Shanghai, China. pp.249-252, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4085

Conference Proceedings

4. Evaluating optical and supersmooth surface using AFM in optical maunfacturing technology

Li,J. ; Xiao,S. ; Li,X. ; Ying,A. ; Zhao,A.

Pub. info.:	Optical metrology roadmap for the semiconductor, optical, and data storage industries , 30-31 July 2000, San Diego, USA. pp.59-64, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4099

Conference Proceedings

5. Evaluation of an optical surface using nanometrology in optical manufacturing technology

Li,J. ; Zhao,A. ; Li,X. ; Zhang,X. ; Wang,M.

Pub. info.:	Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China. pp.566-568, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4231

Conference Proceedings

6. Object tracking under compressed domain

Li,X. ; Sethi,I.K.

Pub. info.:	Image and video communications and processing 2000 : 25-28 January 2000, San Jose, California. pp.508-514, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3974

Conference Proceedings

7. Far-field distribution of some laser modes and the effect of spatial coherence

Jiang,J. ; Cheng,Z. ; Li,X. ; Xu,G. ; Shi,H. ; Xia,J.

Pub. info.:	High-power laser ablation III, 24-28 April 2000, Santa Fe, USA. pp.876-883, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4065

Conference Proceedings

8. Optical emission study of the plasma plume dynamics during excimer laser ablation of carbon in nitrogen atmosphere

Fu,G. ; Yu,W. ; Wang,S. ; Li,X. ; Zhang,L. ; Han,L.

Pub. info.:	Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China. pp.352-356, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4221

Conference Proceedings

9. InP-based monolithic integration of 1.55-･ｪm MQW laser diode and HBT driver circuit

Li,X.-J. ; Zhao,F.-H. ; Zeng,Q.-M. ; Dong,Y. ; Li,X. ; Yang,S.-R. ; Cai,K.-L. ; Wang,B.-Z. ; Ao,J.-P. ; Liang,C.-G. ; Liu,S.-Y.

Pub. info.:	WDM and photonic switching devices for network applications : 27-28 January 2000, San Jose, Calofornia. pp.138-145, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3949

10.

Conference Proceedings

10. Application of neural network in medical images

Li,X. ; Sethi,I.K.

Pub. info.:	Applications of artificial neural networks in image processing V : 27-28 January 2000, San Jose, California. pp.162-169, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3962

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