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25 results

Conference Proceedings

1. Irregular sampling algorithm for general subspaces

Li,S.

Pub. info.:	Wavelet applications in signal and image processing VIII : 31 July-4 August, 2000, San Diego, USA. 4119 pp.24-35, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4119

Conference Proceedings

2. Multiphoton up-converting phosphors for use in rapid immunoassays

Niedbala,R.S. ; Vail,T.L. ; Feindt,H. ; Li,S. ; Burton,J.L.

Pub. info.:	In-vitro diagnostic instrumentation : 26-27 January 2000, San Jose, California. pp.193-203, 2000. Bellingham, Washington. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3913

Conference Proceedings

3. Sensitive intracavity photoacoustic spectrometer based on CO2 waveguide laser

Li,S. ; Yu,Q. ; Chen,Z. ; Lin,J.

Pub. info.:	Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China. pp.145-148, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4223

Conference Proceedings

4. Design method and computer simulation of a binary optical high-power laser cavity based on diffractive optics

Zhang,G. ; Ye,J. ; Li,S. ; Xu,Q. ; Fu,G.

Pub. info.:	Advanced high-power lasers : 1-5 November 1999, Osaka, Japan. pp.702-709, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3889

Conference Proceedings

5. Rotating compensator spectroscopic ellipsometry (RCSE) and its application to high-k dielectric film HfO2

Leng,J. ; Li,S. ; Opsal,J.L. ; Aspnes,D.E. ; Lee,B.H. ; Lee,J.C.

Pub. info.:	Optical metrology roadmap for the semiconductor, optical, and data storage industries , 30-31 July 2000, San Diego, USA. pp.228-234, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4099

Conference Proceedings

6. Dynamic speckle pattern technique on measuring in-plane deformation of metal surface

Li,J. ; Li,S. ; Sun,Y. ; An,H.

Pub. info.:	24th International Congress on High-Speed Photography and Photonics : 24-29 September 2000, Sendai, Japan. pp.309-312, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4183

Conference Proceedings

7. Single-mode lasing of InGaAs/InGaAsP MQWs microdisk lasers with low threshold

Pan,Y. ; Ning,Y. ; Suo,H. ; Liu,Y. ; Wang,L. ; Lin,J. ; Wu,D. ; Li,S.

Pub. info.:	Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.244-247, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4086

Conference Proceedings

8. Boundary effects in 3D wavelet video coding

Xu,J. ; Xiong,Z. ; Li,S. ; Zhang,Y.-Q.

Pub. info.:	Applications of digital image processing XXIII : 31 July - 3 August 2000, San Diego, USA. pp.406-417, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4115

Conference Proceedings

9. Face detection by learning from positive examples

Li,S. ; Lu,J. ; Yang,J.

Pub. info.:	Intelligent robots and computer vision XIX : algorithms, techniques, and active vision : 7-8 November 2000, Boston, USA. pp.316-327, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4197

10.

Conference Proceedings

10. Object pose estimation for robotic control with 3D range data

Li,S. ; Zhao,D.

Pub. info.:	Machine vision and three-dimensional imaging systems for inspection and metrology : 6-8 November 2001 [i.e. 2000], Boston, USA. pp.179-190, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4189

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