1.

Conference Proceedings

Conference Proceedings
Qian,W. ; Li,L. ; Sun,X. ; Clark,R.A.
Pub. info.: Wavelet applications in signal and image processing VIII : 31 July-4 August, 2000, San Diego, USA.  4119  pp.596-604,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4119
2.

Conference Proceedings

Conference Proceedings
Li,Y. ; Li,L. ; Dai,Y. ; Zhu,J. ; Li,Z.
Pub. info.: Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China.  pp.472-476,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4231
3.

Conference Proceedings

Conference Proceedings
Dai,Y. ; Li,Y. ; Li,L. ; Zhu,J.
Pub. info.: Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China.  pp.594-602,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4231
4.

Conference Proceedings

Conference Proceedings
Li,L. ; Cai,H. ; Qu,R. ; Fang,Z.
Pub. info.: Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China.  pp.149-153,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4221
5.

Conference Proceedings

Conference Proceedings
Zhang,X. ; Cao,Z. ; Bai,Z. ; Li,L. ; Zhao,Z. ; Du,J.
Pub. info.: Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China.  pp.209-212,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4221
6.

Conference Proceedings

Conference Proceedings
Zhang,X. ; Cao,Z. ; Li,L. ; Bai,Z. ; Liu,J. ; Wang,W.
Pub. info.: Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China.  pp.205-208,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4221
7.

Conference Proceedings

Conference Proceedings
Yang,D. ; Fan,R. ; Shen,Y. ; Tian,D. ; Li,L. ; Que,D.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.357-361,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4218
8.

Conference Proceedings

Conference Proceedings
Sun,Y. ; Cao,G. ; Li,L.
Pub. info.: Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China.  pp.231-234,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4223
9.

Conference Proceedings

Conference Proceedings
Liang,B. ; Li,L. ; Li,M. ; Li,B. ; Jiang,L.
Pub. info.: Organic photorefractives, photoreceptors, and nanocomposites : 31 July-1 August 2000, San Diego, USA.  pp.64-70,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4104
10.

Conference Proceedings

Conference Proceedings
Li,L.
Pub. info.: Optical interconnects for telecommunication and data communications, 8-10 November 2000, Beijing, China.  pp.201-203,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4225