1.

Conference Proceedings
Conference Proceedings
1. Interfield sampling method dependency of overlay and global alignment
Hong,J. ; Lee,J. ; Cho,H. ; Moon,J. ; Lee,S.
Pub. info.: Metrology, inspection, and process control for microlithography XIV : 28 February - 2 March 2000, San Clara, California.  pp.856-862,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3998
2.

Conference Proceedings
Conference Proceedings
2. Optimally curved electrodes for a rotary microactuator
Jung,S. ; Jeon,J.U. ; Pak,Y.E. ; Lee,S.
Pub. info.: Smart structures and materials 2000 : smart electronics and MEMS : 6-8 March, 2000, Newport Beach, USA.  pp.178-184,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3990
3.

Conference Proceedings
Conference Proceedings
3. Pointing and tracking subsystem design for optical communications link between the International Space Station and ground
Lee,S. ; Alexander,J.W. ; Jeganathan,M.
Pub. info.: Free-space laser communication technologies XII : 24 January 2000, San Jose, California.  pp.150-157,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3932
4.

Conference Proceedings
Conference Proceedings
4. Effect of chirping on optical bistability in ｦﾋ/4-shifted semiconductor distributed feedback structures
Yoon,T.-H. ; Kim,Y.-I. ; Park,K.-W. ; Lee,S. ; Kim,S.H.
Pub. info.: Physics and simulation of optoelectronic devices VIII : 24-28 January 2000, San Jose, USA.  Part1  pp.471-478,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3944
5.

Conference Proceedings
Conference Proceedings
5. Patterning 220-nm pitch DRAM patterns by using double mask exposure
Nam,D. ; Seong,N. ; Cho,H. ; Moon,J. ; Lee,S.
Pub. info.: Optical microlithography XIII : 1-3 March 2000, Santa Clara, USA.  Part1  pp.283-292,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4000
6.

Conference Proceedings
Conference Proceedings
6. Pattern asymmetry correction using assist patterns
Ryoo,M. ; Nam,D. ; Cho,H. ; Moon,J. ; Lee,S.
Pub. info.: Optical microlithography XIII : 1-3 March 2000, Santa Clara, USA.  Part1  pp.307-314,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4000
7.

Conference Proceedings
Conference Proceedings
7. Linear scale-invariant system models for self-similar wireless traffic characterization
Rao,R.M. ; Lee,S. ; Dianat,S.A. ; Mathew,A.V.
Pub. info.: Digital wireless communication II : 27-28 April, Orlando, USA.  pp.19-29,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4045
8.

Conference Proceedings
Conference Proceedings
8. Photomechanical drug delivery
Doukas,A.G. ; Lee,S.
Pub. info.: Biomedical optoacoustics : 25-27 January 2000, San Jose, USA.  pp.188-197,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3916
9.

Conference Proceedings
Conference Proceedings
9. Simulation code generation on the WWW using object-oriented manufacturing resource model
Lee,S.
Pub. info.: Network intelligence : Internet-based manufacturing : 8 November 2000, Boston, USA.  pp.84-95,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4208
10.

Conference Proceedings
Conference Proceedings
10. Web-based remote machine control system in Java
Lee,S.
Pub. info.: Network intelligence : Internet-based manufacturing : 8 November 2000, Boston, USA.  pp.1-12,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4208