1.

Conference Proceedings

Conference Proceedings
Monahan,K.M. ; Ashkenaz,S.M. ; Chen,X. ; Lord,P.J. ; Merrill,M.A. ; Quattrini,R. ; Wiley,J.N.
Pub. info.: Metrology, inspection, and process control for microlithography XIV : 28 February - 2 March 2000, San Clara, California.  pp.492-503,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3998
2.

Conference Proceedings

Conference Proceedings
Xu,Y.Q. ; Wang,Y.Q. ; Wu,N.J. ; Ignatiev,A. ; Chen,X.
Pub. info.: Infrared Detectors and Focal Plane Arrays VI : 25-27 April 2000, Orlando, USA.  pp.66-71,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4028
3.

Conference Proceedings

Conference Proceedings
Li,M. ; Chen,X. ; Wang,J. ; Yang,J. ; Wu,G. ; Zhao,L.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.823-826,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
4.

Conference Proceedings

Conference Proceedings
Chen,X. ; Qiu,P.
Pub. info.: Advanced photonic sensors : Technology and applications, 8-10 Novenber 2000, Beijing, China.  pp.273-276,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4220
5.

Conference Proceedings

Conference Proceedings
Chen,X. ; Nie,Y.
Pub. info.: Inorganic optical materials II : 1-3 August, 2000, San Diego, USA.  pp.307-315,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4102
6.

Conference Proceedings

Conference Proceedings
King,B.M. ; Neifeld,M.A. ; Chen,X.
Pub. info.: Optics in computing 2000 : 18-23 June 2000, Quebec city, Canada.  pp.132-137,  2000.  Bellingham, WA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4089
7.

Conference Proceedings

Conference Proceedings
Wang,Z. ; Kun,C. ; Ma,Y. ; Chen,B. ; Cao,J. ; Zhou,Z. ; Chen,X. ; Michette,A.G.
Pub. info.: Soft X-ray and EUV imaging systems : 3-4 August 2000, San Diego, USA.  pp.83-90,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4146
8.

Conference Proceedings

Conference Proceedings
Chen,X. ; Xia,Y. ; Xie,S. ; Chen,Y.
Pub. info.: Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China.  pp.55-60,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4223
9.

Conference Proceedings

Conference Proceedings
He,X. ; Wan,X. ; Gong,Y. ; Fang,L. ; Chen,X. ; Gao,Y.
Pub. info.: Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China.  pp.370-374,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4221
10.

Conference Proceedings

Conference Proceedings
Yang,J. ; Wang,S. ; Chen,X. ; Fang,W. ; Yu,M. ; Huang,G. ; Li,H.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.100-103,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086