1.

Conference Proceedings

Conference Proceedings
Xu,D. ; Wang,L. ; Ding,G. ; Zhou,Y. ; Yu,A. ; Cheng,X. ; Chen,J. ; Cai,B.
Pub. info.: Micromachining and microfabrication process technology VI : 18-20 September 2000, Santa Clara, USA.  pp.324-330,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4174
2.

Conference Proceedings

Conference Proceedings
Chen,J. ; Li,Y. ; Wu,C.
Pub. info.: Wavelet applications in signal and image processing VIII : 31 July-4 August, 2000, San Diego, USA.  4119  pp.996-1001,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4119
3.

Conference Proceedings

Conference Proceedings
Walton,I.D. ; Dietz,L.J. ; Frenzel,G. ; Chen,J. ; Winkler,J. ; Norton,S.M. ; Kantor,A.B.
Pub. info.: Advances in nucleic acid and protein analyses,manipulation, and sequencing : 26-27 January 2000, San Jose, California.  pp.192-201,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3926
4.

Conference Proceedings

Conference Proceedings
Cheng,P. ; Lin,B.-L. ; Kao,F.-J. ; Sun,C.-K. ; Wang,Y.-S. ; Liu,T.-M. ; Wang,Y. ; Chen,J. ; Huang,M.-K. ; Johnson,I.
Pub. info.: Optical sensing, imaging, and manipulation for biological and biomedical applications : 26-28 July 2000, Taipei, Taiwan.  pp.87-91,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4082
5.

Conference Proceedings

Conference Proceedings
Lin,B.-L. ; Kao,F.-J. ; Cheng,P. ; Sun,C.-K. ; Chen,R.-W. ; Wang,Y. ; Chen,J. ; Wang,Y.-S. ; Liu,T.-M. ; Huang,M.-K.
Pub. info.: Optical sensing, imaging, and manipulation for biological and biomedical applications : 26-28 July 2000, Taipei, Taiwan.  pp.100-104,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4082
6.

Conference Proceedings

Conference Proceedings
Chen,J.
Pub. info.: Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China.  pp.1-4,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4221
7.

Conference Proceedings

Conference Proceedings
Chen,J. ; Wang,W. ; Li,Z.
Pub. info.: Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China.  pp.189-193,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4223
8.

Conference Proceedings

Conference Proceedings
Chen,J. ; Li,Q. ; Xu,J.
Pub. info.: Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China.  pp.47-51,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4221
9.

Conference Proceedings

Conference Proceedings
Chen,J. ; Zhang,J. ; Shen,Y. ; Liu,X.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.749-752,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
10.

Conference Proceedings

Conference Proceedings
Shen,Y. ; Zhang,J. ; Chen,J. ; Gu,F. ; Huang,H.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.839-842,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086