Smart structures and materials 2000 : damping and isolation : 6-8 March 2000, Newport Beach, California. pp.121-129, 2000. Bellingham, Washington. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China. pp.28-31, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.116-119, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Commercial and biomedical applications of ultrafast lasers II : 24-25 January 2000, San Jose, California. pp.87-92, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Propagation and imaging through the atmosphere IV : 3 August 2000, San Diego, USA. pp.102-107, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Medical imaging 2000 : physiology and function from multidimensional images, 13-15 February 2000, San Diego, California. pp.146-152, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Medical imaging 2000 : physiology and function from multidimensional images, 13-15 February 2000, San Diego, California. pp.165-171, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China. pp.401-405, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.368-371, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering