1.

Conference Proceedings
Conference Proceedings
1. New 3D surface profile measurement based on phase-shift interfering technology
Liu,B. ; Yang,L. ; Fan,J. ; Zhang,J.
Pub. info.: Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California.  pp.15-17,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3275
2.

Conference Proceedings
Conference Proceedings
2. Object recognition using both range and intensity image in machine vision
Liu,B. ; Wu,L. ; Zhang,J. ; Wang,Q.
Pub. info.: Machine vision applications in industrial inspection IV : 31 January-1 February, 1996, San Jose, California.  pp.91-94,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2665
3.

Conference Proceedings
Conference Proceedings
3. High-power GRIN-SCH lasers with low-threshold-current density and high efficiency
Zhu,D. ; Wang,Z. ; Liang,J. ; Xu,B. ; Zhu,Z. ; Zhang,J. ; Gong,Q. ; Li,S. ; Fang,Z. ; Tu,Y. ; Liu,B. ; Hu,X. ; Han,Q. ; Jin,C.
Pub. info.: Semiconductor Lasers II.  pp.108-111,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2886