1.

Conference Proceedings
Conference Proceedings
1. Online inspection system for steel-plate thickness
Zhang,G. ; Song,J. ; An,Z. ; Li,C. ; Gao,Y. ; Chen,R.
Pub. info.: Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China.  pp.131-137,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3558
2.

Conference Proceedings
Conference Proceedings
2. Application of a semiconductor laser in an optoelectronic system
Jiang,H. ; An,Z. ; Zhao,T. ; Li,C.
Pub. info.: Automated optical inspection for industry : 6-7 November 1996, Beijing, China.  pp.399-408,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2899
3.

Conference Proceedings
Conference Proceedings
3. Theoretical research on an infrared dynamic autodetecting system
An,Z. ; Zhang,G. ; Jiang,H. ; Li,C.
Pub. info.: Automated optical inspection for industry : 6-7 November 1996, Beijing, China.  pp.362-369,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2899
4.

Conference Proceedings
Conference Proceedings
4. Theoretical analysis of the characteristics of a laser-scanned measuring system
Zhang,G. ; An,Z. ; Zhang,C. ; Li,C.
Pub. info.: Automated optical inspection for industry : 6-7 November 1996, Beijing, China.  pp.338-347,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2899
5.

Conference Proceedings
Conference Proceedings
5. Optoelectronic noncontact inspection method of taper
Zhang,G. ; An,Z. ; Jiang,H. ; Li,C. ; Gao,Y. ; Chen,R.
Pub. info.: Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China.  pp.239-243,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3558