1.

Conference Proceedings
Conference Proceedings
1. *CORRELATION OF ELECTRICAL PROPERTIES WITH STRUCTURE IMAGING OF SEMICONDUCTOR INTERFACES
batstone, J. L. ; Gibson, J. M. ; Tung, R. T. ; Levi, A. F. J. ; Outten, C. A.
Pub. info.: Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, U.S.A..  pp.335-348,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 82
2.

Conference Proceedings
Conference Proceedings
2. IMPLANTED DOPANT-DEFECT INTERACTIONS IN GaAs
Pearton, S. J. ; Williams, J. S. ; Short, K. T. ; Johnson, S. T. ; Gibson, J. M. ; Jacobson, D. C. ; Poate, J. M. ; Boerma, D. O.
Pub. info.: Materials modification and growth using Ion beams : symposium held April 21-23, 1987, Anaheim, California, U.S.A..  pp.59-66,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 93
3.

Conference Proceedings
Conference Proceedings
3. MESOTAXY: SINGLE-CRYSTAL GROWTH OF BURIED SILICIDE LAYERS
White, Alice E.. ; Short, K.. T. ; Dynes, R. C. ; Garno, J. P. ; Gibson, J. M.
Pub. info.: Materials modification and growth using Ion beams : symposium held April 21-23, 1987, Anaheim, California, U.S.A..  pp.93-98,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 93
4.

Conference Proceedings
Conference Proceedings
4. CHARACTERIZATION OF GaAs GROWN BY DIRECT DEPOSITION ON Si
Vernon, S. M. ; Pearton, s. J. ; Gibson, J. M. ; Caruso, R. ; Abernathy, C. R. ; Short, K. T. ; Stavola, M. ; Haven, V. E. ; Jacobson, D. C.
Pub. info.: Heteroepitaxy on silicon II : symposium held April 21-23, 1987, Anaheim, California, U.S.A..  pp.187-192,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 91
5.

Conference Proceedings
Conference Proceedings
5. IMPROVING SIGNAL-TO-NOISE LIMITS IN HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY
Gibson, J. M. ; McDonald, M. L.
Pub. info.: Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, U.S.A..  pp.109-114,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 82
6.

Conference Proceedings
Conference Proceedings
6. CHARACTERIZATION OF ULTRAHIN CoSi2 ON Si (111) LAYERS
Batstone, J. L. ; Phillips, J. M. ; Gibson, J. M.
Pub. info.: Heteroepitaxy on silicon II : symposium held April 21-23, 1987, Anaheim, California, U.S.A..  pp.445-450,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 91
7.

Conference Proceedings
Conference Proceedings
7. GROWTH OF SINGLE CRYSTAL TYPE A AND TYPE B CoXNi1-XSi2 LAYERS ON Si (111)
Tung, R. T. ; Heliman, F. ; Gibson, J. M. ; Boone, T.
Pub. info.: Heteroepitaxy on silicon II : symposium held April 21-23, 1987, Anaheim, California, U.S.A..  pp.451-456,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 91