1.

Conference Proceedings
Conference Proceedings
1. EXPERIMENTAL AND THEORETICAL ANALYSIS OF STRAIN RELAXATION IN GeXSi1-X/Si(100) HETEROEPITAXY
Hull, R. ; Bean, J. C.
Pub. info.: Chemistry and defects in semiconductor heterostructures.  pp.309-316,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 148
2.

Conference Proceedings
Conference Proceedings
2. TRANSMISSION ELECTRON MICROSCOPY OF STRAINED-LAYER SUPERLATTICES
Gibson, J. M. ; Treacy, M. M. J. ; Hull, R. ; Bean, J. C.
Pub. info.: Layered structures, epitaxy, and interfaces : symposium held November 26-30, 1984, Boston, Massachusetts, U.S.A..  pp.267-274,  1985.  Pittsburgh.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 37
3.

Conference Proceedings
Conference Proceedings
3. INTERFACIAL STRUCTURE AND STABILITY IN GeXSil-X/Si STRAINED LAYERS
Hull, R. ; Bean, J. C. ; Gibson, J. M. ; Marcantonio, K. J. ; Fiory, A. T. ; Nakahara, S.
Pub. info.: Layered structures, epitaxy, and interfaces : symposium held November 26-30, 1984, Boston, Massachusetts, U.S.A..  pp.261-266,  1985.  Pittsburgh.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 37
4.

Conference Proceedings
Conference Proceedings
4. HETERONUCLEATION ONTO Si SURFACES
Hull, R. ; Bean, J. C. ; Chand, N. ; Leibenguth, R. E. ; Bahnck, D. ; Koch, S. M. ; Harris Jr., J. S.
Pub. info.: Epitaxy of semiconductor layered structures : symposium held November 30-December 4, 1987, Boston, Massachusetts, U.S.A..  pp.455-462,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 102