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10 results

Conference Proceedings

1. Optically Detected Cyclotron Resonance for Defect Characterization

Godlewski,M. ; Chen,W.M. ; Monemar,B.

Pub. info.:	Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.3 pp.1353-1358, 1994. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	143-147

Conference Proceedings

2. Magnetic Resonance Techniques for Excited State Spectroscopy of Defects in Silicon

Chen,W.M. ; Monemar,B. ; Frens,A.M. ; Bennebroek,M.T. ; Schmidt,J.(invited)

Pub. info.:	Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.3 pp.1345-1352, 1994. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	143-147

Conference Proceedings

3. The Configurational Change of a Metastable S-Cu Defect in Silicon

Chen,W.M. ; Janzen,E. ; Monemar,B. ; Henry,A. ; Frens,A.M. ; Bennebroek,M.T. ; Schmidt,J.

Pub. info.:	Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.2 pp.1179-1184, 1994. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	143-147

Conference Proceedings

4. A New Photoluminescent Center in Mercury-Doped Silicon

Henry,A. ; Monemar,B. ; Bergman,J.P. ; Lindstrom,J.L. ; Zhang,Y. ; Corbett,J.W.

Pub. info.:	Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.1 pp.117-122, 1994. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	143-147

Conference Proceedings

5. Electronic Structure of PIn Antisite in InP

Chen,W.M. ; Dreszer,P. ; Leon,R. ; Sorman,E.R.Weber E. ; Monemar,B. ; Liang,B.W. ; Tu,C.W.

Pub. info.:	Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.1 pp.211-216, 1994. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	143-147

Conference Proceedings

6. Iron Acceptors in Gallium Nitride(GaN)

Maier,K. ; Kunzer,M. ; Kaufmann,U. ; Schneider,J. ; Monemar,B. ; Akasaki,I. ; Amano,H.

Pub. info.:	Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.1 pp.93-98, 1994. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	143-147

Conference Proceedings

7. A Metastable Selenium-Related Center in Silicon

Henry,A. ; Sorman,E. ; Andersson,S. ; Chen,W.M. ; Monemar,B. ; Janzen,E.

Pub. info.:	Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.1 pp.159-164, 1994. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	143-147

Conference Proceedings

8. Confinement Effects on the Electronic Structure of Shallow Acceptors in GaAs/AlGaAs Quantum Wells

Holtz,P.O. ; Zhao,Q.X. ; Monemar,B. ; Sundaram,M. ; Merz,J.L. ; Gossard,A.C.

Pub. info.:	Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.1 pp.657-662, 1994. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	143-147

Conference Proceedings

9. Non-Radiative Recombination via Deep Level Defects in Undoped GaAs/AlGaAs Quantum Wells

Bergman,J.P. ; Holtz,P.O. ; Monemar,B. ; Sundaram,M. ; Merz,J.L. ; Gossard,A.C.

Pub. info.:	Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.1 pp.629-634, 1994. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	143-147

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Conference Proceedings

10. Observation of Rapid Direct Charge Transfer between Deep Defects in Silicon

Frens,A.M. ; Bennebroek,M.T. ; Zakrzewski,A. ; Schmidt,J. ; Chen,W.M. ; Janzen,E. ; Lindstrom,J.L. ; Monemar,B.

Pub. info.:	Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.3 pp.1371-1374, 1994. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	143-147

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