1.

Conference Proceedings
Conference Proceedings
1. Refractive index and compositional depth profiles in high energy SiMOX structures
Hatzopoulos, N. ; Siapkas, D.I. ; Katsidis, C.C. ; Zorba, T. ; Hemment, P.L.F.
Pub. info.: Proceedings of the Sixth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.173-178,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-11
2.

Conference Proceedings
Conference Proceedings
2. Structural characterization by RBS and TEM of SiC buried layers formed by ion beam synthesis at high temperature
Nejim, A. ; Hemment, P.L.F. ; Stoemenos, J.
Pub. info.: Proceedings of the Sixth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.167-172,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-11
3.

Conference Proceedings
Conference Proceedings
3. Formation and characterization of double SIMOX structures by sequential high and low energy oxygen implantation into silicon
Hatzopoulos, N. ; Siapkas, D.I. ; Hemment, P.L.F. ; Skorupa, W.
Pub. info.: Proceedings of the Sixth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.123-128,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-11
4.

Conference Proceedings
Conference Proceedings
4. Introductory Remarks
Hemment, P.L.F.
Pub. info.: Proceedings of the Sixth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.131-132,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-11
5.

Conference Proceedings
Conference Proceedings
5. Nucleation of oxidation induced stacking faults (01SF) in ion implanted SIMOX structures
Giles, L.F. ; Nejim, A. ; Cristiano, F. ; Hemment, P.L.F.
Pub. info.: Proceedings of the Sixth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.98-103,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-11
6.

Conference Proceedings
Conference Proceedings
6. Synthesis of a buried oxide in related Si0.5Ge0.5 material using high energy oxygen implantation
Zhang, J.P. ; Hemment, P.L.F. ; Newstead, S.M. ; Powell, A.R. ; Whall, T.E. ; Parker, E.H.C.
Pub. info.: Proceedings of the Sixth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.44-49,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-11
7.

Conference Proceedings
Conference Proceedings
7. Delineation of crystallographic defects in ultra thin SIMOX materials produced by low energy low dose oxygen implantation
Giles, L.F. ; Meyyappan, N. ; Nejim, A. ; Blake, J. ; Cristiano, F. ; Hemment, P.L.F.
Pub. info.: Proceedings of the Sixth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.50-56,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-11