1.

Conference Proceedings
Conference Proceedings
1. CHARACTERIZATION OF GaAs-InAs HETEROSTRUCTURES BY MICRO-RAMAN SPECTROSCOPY
Ichimura, Masaya ; Moriguchi, Yukihisa ; Usami, Akira ; Wada, Takao ; Tabuchi, Masao ; Sasaki, Akio
Pub. info.: Heteroepitaxy of dissimilar materials : symposium held April 29-May 2, 1991, Anaheim, California, U.S.A..  pp.465-470,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 221
2.

Conference Proceedings
Conference Proceedings
2. AUTOMATIC DETERMINATION OF IN-DEPTH PROFILES OF RECOMBINATION LIFETIME IN EPITAXIAL Si LAYER WITH P+-N--N+ STRIPE TEST PATTERN DIODES
Usami, Akira ; Fujii, Yoshimaro ; Fujiwara, Hideki ; Sone, Tomiyasu ; Wada, Takao
Pub. info.: Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A..  pp.265-270,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 225
3.

Conference Proceedings
Conference Proceedings
3. EFFECTS OF RAPID THERMAL ANNEALING ON PHOTORESPONSE OF GaAs/Si HETERO-STRUCTURE
Ito, Akira ; Usami, Akira ; Kano, Hiroyuki ; Wada, Takao
Pub. info.: Rapid thermal and integrated processing : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A..  pp.473-478,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 224
4.

Conference Proceedings
Conference Proceedings
4. VARIATION OF THERMAL DONORS IN DIFFUSED WAFERS BY RAPID THERMAL ANNEALING
Sugiyami, Takahide ; Usami, Akir a ; Ito, Akira ; Natori, Taichi ; Wada, Takao
Pub. info.: Rapid thermal and integrated processing : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A..  pp.75-80,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 224
5.

Conference Proceedings
Conference Proceedings
5. STUDIES OF OXYGEN INTRODUCED DURING THERMAL OXIDATION AND DEFECTS INDUCED BY RAPID THERMAL ANNEALING IN SILICON EPITAXIAL LAYERS
Usami, Akira ; Natori, taichi ; Ito, Akira ; Sugiyama, Takahide ; Hirota, Seiya ; Tokuda, Yutaka ; Wada, Takao
Pub. info.: Rapid thermal and integrated processing : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A..  pp.95-102,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 224