1.

Conference Proceedings
Conference Proceedings
1. X-RAY REFLECTOMETRY FROM SEMICONDUCTOR SURFACES AND INTERFACES
Tanner, Brian K. ; Miles, Simon J. ; Keith Bowen, D. ; Hart, Linda ; Loxley, Neil
Pub. info.: Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A..  pp.345-350,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 208
2.

Conference Proceedings
Conference Proceedings
2. DOUBLE AXIS X-RAY DIFFRACTOMETRY ANALYSIS OF THE HOMOEPITAXIAL INTERFACE BETWEEN SUBSTRATE AND BUFFER LAYER
Stephan Green, G. ; Tanner, Brian K. ; Kightley, Philip
Pub. info.: Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A..  pp.315-320,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 208
3.

Conference Proceedings
Conference Proceedings
3. X-RAY TOPOGRAPHY STUDIES OF OXYGEN PRECIPITATES IN MCZ SILICON
Holland, Anthony J. ; Stephan Green, G. ; Tanner, Brian K. ; Zhenhong, Mai
Pub. info.: Defects in materials : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A..  pp.475-480,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 209
4.

Conference Proceedings
Conference Proceedings
4. APPLICATION OF A DESK-SIDE DOUBLE-AXIS X-RAY DIFFRACTOMETER FOR VERY LARGE AREA EPILAYER CHARACTERIZATION
Loxley, Neil ; Keith Bowen, D. ; Tanner, Brian K.
Pub. info.: Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A..  pp.119-124,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 208
5.

Conference Proceedings
Conference Proceedings
5. THE PERFORMANCE OF CHANNEL CUT COLLIMATORS FOR PRECISION X-RAY DIFFRACTION STUDIES OF EPITAXIAL LAYERS
Loxley, Neil ; Keith Bowen, D. ; Tanner, Brian K.
Pub. info.: Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A..  pp.107-112,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 208
6.

Conference Proceedings
Conference Proceedings
6. PRINCIPLES AND PERFORMANCE OF A PC-BASED PROGRAM FOR SIMULATION OF DOUBLE-AXIS X-RAY ROCKING CURVES OF THIN EPITAXIAL FILMS
Keith Bowen, D. ; Loxley, Neil ; Tanner, Brian K. ; Cooke, Lynne ; Capano, Michael A.
Pub. info.: Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A..  pp.113-118,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 208