1.

Conference Proceedings
Conference Proceedings
1. COMBINED TEM AND X-RAY TOPOGRAPHIC CHARACTERIZATION OF InXGa1-XAs/GaAs STRAINED LAYER SYSTEMS
Dudley, Michael ; Yao, Gong-Da ; Paine, David ; Howard, David ; Sacks, Robert N.
Pub. info.: Defects in materials : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A..  pp.655-660,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 209
2.

Conference Proceedings
Conference Proceedings
2. INFLUENCE OF SURFACE RELAXATION ON X-RAY TOPOGRAPHIC IMAGING OF INTERFACIAL DISLOCATIONS IN HETEROSYSTEMS
Yao, Gong-Da ; Wu, Jun ; Dudley, Michael ; Shastry, Vijay ; Anderson, Peter
Pub. info.: Defects in materials : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A..  pp.707-712,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 209
3.

Conference Proceedings
Conference Proceedings
3. SYNCHROTRON X-RAY TOPOGRAPHIC STUDY OF THE BEHAVIOR OF DEFECTS IN HIGH CARBON-CONTENT Si WAFERS DURING RTP
Fanning, Thomas ; Dudley, Michael ; Wang, Franklin F. Y. ; Gordon-Smith, David
Pub. info.: Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A..  pp.301-306,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 225
4.

Conference Proceedings
Conference Proceedings
4. SYNCHROTRON TOPOGRAPHIC STUDIES OF THE INFLUENCE OF RAPID THERMAL PROCESSING ON DEFECT STRUCTURES IN SINGLE CRYSTAL SILICON
Dudley, Michael ; Wang, Franklin F.Y. ; Fanning, Thomas ; Tolis, Georgios ; Wu, Jun ; Hodul, David T.
Pub. info.: Defects in materials : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A..  pp.511-516,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 209
5.

Conference Proceedings
Conference Proceedings
5. SYNCHROTRON X-RAY TOPOGRAPHY AS A NON-DESTRUCTIVE MONITOR OF DAMAGE ACCOMPANYING IC PROCESSING
Dudley, Michael ; Wang, Franklyn F. Y. ; Fanning, Thomas ; Gordon-Smith, David
Pub. info.: Rapid thermal and integrated processing : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A..  pp.61-66,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 224