1.

Conference Proceedings
Conference Proceedings
1. Measurement of roughness of optical surface by focal plane CCD camera
Li,J. ; Li,X. ; Ying,A. ; Zao,A. ; Zhang,X.
Pub. info.: Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California.  pp.84-87,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3275
2.

Conference Proceedings
Conference Proceedings
2. Optical and structural characteristics of lnGaAsIGaAs strained-layer superlattice
Li,M. ; Li,X. ; Song,X. ; Ge,Z. ; Zhang,X.
Pub. info.: Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China.  pp.64-66,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3557
3.

Conference Proceedings
Conference Proceedings
3. Analysis of the thickness measurement of multilayer optical thin films with grazing incident x ray
Li,X. ; Song,X. ; Qu,Y. ; Li,M. ; Zhang,X.
Pub. info.: Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China.  pp.470-473,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3175
4.

Conference Proceedings
Conference Proceedings
4. Nondestructive measurement of layer thickness in double heterostructures x ray by double crystal diffraction
Qu,Y. ; Li,X. ; Song,X. ; Zhang,X. ; Wang,L. ; Qie,X.
Pub. info.: Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China.  pp.378-380,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3175
5.

Conference Proceedings
Conference Proceedings
5. MBE technology and semiconductor laser material growth
Liu,G. ; Zhang,Q. ; Yang,H. ; Zhang,X. ; Li,X. ; Qu,Y. ; Song,X. ; Wang,X.
Pub. info.: Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China.  pp.408-411,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3175
6.

Conference Proceedings
Conference Proceedings
6. Evaluation of optical supersmooth surface using AFM and comparison to interference method
Li,J. ; Li,D. ; Zhang,X. ; Li,X. ; Zhao,A.
Pub. info.: Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China.  pp.336-344,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3557
7.

Conference Proceedings
Conference Proceedings
7. Structural characteristic of GaAIAs multiepitaxial layer heterostructure
Li,M. ; Qu,Y. ; Li,X. ; Zhang,X.
Pub. info.: Electro-optic and second harmonic generation materials, devices, and applications II : 18-19 September, 1998, Beijing, China.  pp.162-165,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3556
8.

Conference Proceedings
Conference Proceedings
8. Photoluminescence of GaAlAs/GaAs quantum wells grown by metalorganic chemical vapor deposition
Song,X. ; Qu,Y. ; Li,M. ; Gao,X. ; Li,X. ; Zhang,X.
Pub. info.: Electro-optic and second harmonic generation materials, devices, and applications II : 18-19 September, 1998, Beijing, China.  pp.170-172,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3556