Liu, Q. ; Yang, K. ; Liu, J. ; Tan, D. ; Gao, Y. ; Yu, L.
Pub. info.:
Optical design and testing II : 8-12 November 2004, Beijing, China. pp.937-940, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Deng, X. ; Ye, H. ; Tan, D. ; Zhang, X. ; Yang, K. ; Liu, Q ; Lei, X. ; Yu, L. ; Xia, M. ; Li, W.
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Holography, diffractive optics, and applications II : 8-11 November 2004, Beijing, China. pp.728-733, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Holography, diffractive optics, and applications II : 8-11 November 2004, Beijing, China. pp.856-866, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Yang, H. ; Park, C. ; Hong, J. ; Jeong, G. ; Cho, B. ; Choi, J. ; Kang, C. ; Yang, K. ; Kang, E. ; Ji, S. ; Yim, D. ; Song, Y.
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Metrology, Inspection, and Process Control for Microlithography XVIII. pp.437-443, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering