1.

Conference Proceedings
Conference Proceedings
1. ORIGIN OF GROWN-IN DISLOCATIONS IN III-V COMPOUND SEMICONDUCTORS EPITAXIAL LAYERS
Nakahara, S. ; Chu, S.N.G.
Pub. info.: Materials problem solving with the transmission electron microscope : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A..  pp.45-48,  1986.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 62
2.

Conference Proceedings
Conference Proceedings
2. RELATIVE LATTICE PARAMETER MEASUREMENT IN QUATERNARY (InGaAsP) LAYERS ON InP SUBSTRATES USING CONVERGENT BEAM ELECTRON DIFFRACTION
Twigg, M.E. ; Chu, S.N.G. ; Joy, D.C. ; Maher, D.M. ; Macrander, A.T. ; Nakahara, S. ; Chin, A.K.
Pub. info.: Materials characterization : symposium held April 15-17, 1986, Palo Alto California, U.S.A..  pp.147-152,  1986.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 69