1.

Conference Proceedings
Conference Proceedings
1. INTERFACIAL STRUCTURE AND STABILITY IN GeXSil-X/Si STRAINED LAYERS
Hull, R. ; Bean, J. C. ; Gibson, J. M. ; Marcantonio, K. J. ; Fiory, A. T. ; Nakahara, S.
Pub. info.: Layered structures, epitaxy, and interfaces : symposium held November 26-30, 1984, Boston, Massachusetts, U.S.A..  pp.261-266,  1985.  Pittsburgh.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 37
2.

Conference Proceedings
Conference Proceedings
2. FORMATION OF STACKING FAULT TETRAHEDRA DURING EPITAXIAL GROWTH OF SILICON AND GERMANIUM-SILICON LAYERS ON {lll} SILICON SUBSTRATES
Brasen, D. ; Nakahara, S. ; Bean, J.C.
Pub. info.: Thin films : interfaces and phenomena : symposium held December 2-6, 1985, Boston, Massachusetts, USA.  pp.273-278,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 54
3.

Conference Proceedings
Conference Proceedings
3. THE EFFECTS OF DOPANTS AND CRYSTAL PERFECTION ON THE CHEMICAL VAPOR DEPOSITION OF TUNGSTEN ON SILICON BY SILICON REDUCTION OF TUNGSTEN HEXAFLUORIDE
Green, M.L. ; Ali, Y.S. ; Davidson, B.A. ; Feldman, L.C. ; Nakahara, S.
Pub. info.: Thin films : interfaces and phenomena : symposium held December 2-6, 1985, Boston, Massachusetts, USA.  pp.723-728,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 54