1.

Conference Proceedings

Conference Proceedings
Kang, E.-J. ; Huh, C. ; Lee, S.-H. ; Jung, J.-J. ; Lee, S.-J. ; Park, S.-J.
Pub. info.: Third international conference on solid state lighting : 5-7 August 2003, San Diego, California, USA.  pp.41-53,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5187
2.

Conference Proceedings

Conference Proceedings
Hwang, J.-S. ; Min, K.-W. ; Lee, S.-H. ; Kim, H. ; Kim, H.-S.
Pub. info.: Smart structures and materials 2004 : sensors and smart structures technologies for civil, mechanical, and aerospace systems : 15-18 March 2004, San Diego, California, USA.  pp.566-577,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5391
3.

Conference Proceedings

Conference Proceedings
Bae, J.-W. ; Lee, S.-H. ; Yoo, J.-S.
Pub. info.: Applications of digital image processing XXVII : 2-6 August 2004, Denver, Colorado, USA.  pp.890-900,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5558
4.

Conference Proceedings

Conference Proceedings
Lee, S.-H. ; Lee, J.-Y. ; Lee, S.-Y. ; Park, C. W. ; Bae, H.-C. ; Kang, J.-Y.(ETRI)
Pub. info.: SiGe: materials, processing, and devices : proceedings of the First international symposium.  pp.385-394,  2004.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-07
5.

Conference Proceedings

Conference Proceedings
Baik, J.-H. ; Lee, D.-J. ; Lee, S.-H. ; Park, S.-H. ; Lee, I.-H. ; Choi, J.-S.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVIII.  pp.753-760,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5375
6.

Conference Proceedings

Conference Proceedings
Hong, C.-S. ; Lee, S.-H. ; Kim, W.-K. ; Kudo, T. ; Timko, A. ; Mckenzie, D. ; Anyadiegwu, C. ; Rahman, D.M. ; Lin, G. ; Dammel, R.R. ; Padmanaban, M.
Pub. info.: Advances in Resist Technology and Processing XXI.  pp.1131-1137,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5376
7.

Conference Proceedings

Conference Proceedings
Kim, S.-H. ; Kim, H.-D. ; Lee, S.-H. ; Park, C.-M. ; Ryoo, M.-H. ; Yeo, G.-S. ; Lee, J.-H. ; Cho, H.-K. ; Han, W.-S. ; Moon, J.-T.
Pub. info.: Advances in Resist Technology and Processing XXI.  pp.1082-1090,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5376
8.

Conference Proceedings

Conference Proceedings
Lee, S.-H. ; Yeh, C.H. ; Kuo, C.-C.J.
Pub. info.: Storage and Retrieval Methods and Applications for Multimedia 2004.  pp.396-407,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5307
9.

Conference Proceedings

Conference Proceedings
Kim, J.-W. ; Son, E.-K. ; Lee, S.-H. ; Kim, D. ; Kim, J. ; Lee, G. ; Jung, J.C. ; Bok, C.K. ; Moon, S.C. ; Shin, K.S.
Pub. info.: Advances in Resist Technology and Processing XXI.  pp.599-607,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5376