Cho, J.S. ; Joo, S.M. ; Cho, S.H. ; Yu, Y.H. ; Kim, I.H. ; Kim, H. ; Han, C.
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Eco-materials processing & design VII : proceedings of the Conference of the 7th International Symposium on Eco-materials Processing & Design, January 8-11 2006, Chengdu, China. pp.1026-1029, 2006. Uetikon-Zuerich. Trans Tech Publications
Cho, S.H. ; Joo, S.M. ; Cho, J.S. ; Yu, Y.H. ; Ahn, J.W. ; Han, C. ; Kim, H.
Pub. info.:
Eco-materials processing & design VII : proceedings of the Conference of the 7th International Symposium on Eco-materials Processing & Design, January 8-11 2006, Chengdu, China. pp.502-505, 2006. Uetikon-Zuerich. Trans Tech Publications
Applications of digital image processing XXIX : 15-17 August 2006, San Diego, California, USA. pp.63121L-, 2006. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Bae, J. ; Kim, J. ; Hwang, I ; Kim, H. ; Lee, J. ; Park, H. ; Tominaga, J.
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Optical Data Storage 2006 : 23-26 April 2006, Montreal, Canada. pp.628217-628218, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Kim, J.J. ; Youn, S.H. ; Hwang, K.H. ; Yoon, J.B. ; Lee, S.G. ; Jun, B.S. ; Lee, J.K. ; Yoon, S.Y. ; Kim, H.
Pub. info.:
Eco-materials processing & design VII : proceedings of the Conference of the 7th International Symposium on Eco-materials Processing & Design, January 8-11 2006, Chengdu, China. pp.598-601, 2006. Uetikon-Zuerich. Trans Tech Publications
Metrology, Inspection, and Process Control for Microlithography XX. pp.61522H-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications XII. pp.63140V-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering