1.

Conference Proceedings

Conference Proceedings
Kang, J. ; Kim, J. ; Jung, S. ; Kim, H. ; Kim, K.
Pub. info.: Optical microlithography XVIII : 1-4 March, 2005, San Jose, California, USA.  pp.537-542,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5754
2.

Conference Proceedings

Conference Proceedings
Kouritzin, M. A. ; Ballantyne, D. J. ; Kim, H. ; Hu, Y.
Pub. info.: Signal processing, sensor fusion, and target recognition XIV : 28-30 March 2005, Orlando, Florida, USA.  pp.244-252,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5809
3.

Conference Proceedings

Conference Proceedings
Kim, H. ; Park, C. -J. ; Kim, S. -E. ; Lee, I. -H.
Pub. info.: Image processing : algorithms and systems IV : 17-18 January 2005, San Jose, California, USA.  pp.269-276,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5672
4.

Conference Proceedings

Conference Proceedings
Kim, M. ; Kim, H. ; Shim, K. ; Jeon, J. ; Gil, M. ; Song, Y. ; Enomoto, T. ; Sakaguchi, T. ; Nakajima, Y.
Pub. info.: Advances in resist technology and processing XXII : 28 February-2 March, 2005, San Jose, California, USA.  pp.10-19,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5753(1)
5.

Conference Proceedings

Conference Proceedings
Lee, B. ; Moon, J. ; Kim, H.
Pub. info.: Biometric technology for human identification II : 28-29 March, 2005, Orlando, Florida, USA.  pp.105-112,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5779
6.

Conference Proceedings

Conference Proceedings
Kim, H. ; Choi, J. ; Lee, K.-N. ; Kim, Y.
Pub. info.: Microfluidics, bioMEMS, and medical microsystems III : 24-26 January 2005, San Jose, California, USA.  pp.168-178,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5718
7.

Conference Proceedings

Conference Proceedings
Kim, Y.-S. ; Hyun, Y.-S. ; Kong, K.-K. ; Kim, H. ; Choi, B.-H.
Pub. info.: Optical microlithography XVIII : 1-4 March, 2005, San Jose, California, USA.  pp.1388-1394,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5754
8.

Conference Proceedings

Conference Proceedings
Kim, H. ; Park, D.
Pub. info.: Optical microlithography XVIII : 1-4 March, 2005, San Jose, California, USA.  pp.1430-1436,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5754
9.

Conference Proceedings

Conference Proceedings
Lee, J.C. ; Rhee, S. ; Kang, C. ; Choi, C. ; Krishnan, S. ; Ok, I. ; Akbar, M. ; Kim, H. ; Zhu, F. ; Zhang, M. ; Lee, T.
Pub. info.: Silicon nitride, silicon dioxide thin insulating films, and other emerging dieletrics VIII : proceedings of the international symposium.  pp.389-402,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-01
10.

Conference Proceedings

Conference Proceedings
Cho, J. Y. ; Lee, H. J. ; Kim, H. ; Szpunar, J. A.
Pub. info.: Textures of materials : ICOTOM 14 : Proceedings of the 14th International Conference on Textures of Materials, held in Leuven, Belgium, July 11-15, 2005.  pp.1377-1382,  2005.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 495-497(2)