1.

Conference Proceedings
Conference Proceedings
1. The benefit of SOI technologies for low-voltage RFID applications
Viliard, P. ; Jomaah, J. ; Gomez, B. ; De Pontcharra, J. ; Save, D. ; Chouteau, S. ; Mackowiak, E.
Pub. info.: Silicon-on-insulator technology and devices XI : proceedings of the international symposium.  pp.243-248,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-5
2.

Conference Proceedings
Conference Proceedings
2. Scaling Issues for Advanced SOI Devices: Gate Oxide Tunneling, Thin Buried Oxide, and Ultra-Thin Films
Pretet, J. ; Ohata, A. ; Dieudonne, F. ; Allibert, F. ; Bresson, N. ; Matsumoto, T. ; Poiroux, T. ; Jomaah, J. ; Cristoloveanu, S.
Pub. info.: Silicon nitride and silicon dioxide thin insulating films VII : proceedings of the international symposium.  pp.476-487,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-2
3.

Conference Proceedings
Conference Proceedings
3. Impact of quantum-mechanical effects on the double-gate MOSFET characteristics
Dauge, F. ; Jomaah, J. ; Ghibaudo, G.
Pub. info.: Silicon-on-insulator technology and devices XI : proceedings of the international symposium.  pp.383-388,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-5
4.

Conference Proceedings
Conference Proceedings
4. An overview of low-frequency noise in advanced CMOS/SOI transistors (Invited Paper)
Jomaah, J. ; Balestra, F.
Pub. info.: Noise in Devices and Circuits.  pp.159-167,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5113