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15 results

Conference Proceedings

1. PICOSECOND OPTICAL DETERMINATION OF CARRIER LIFETIME IN POLYSILICON FILMS

Bambha, N. K. ; Nighan, W. L. ; Campbell, I. H. ; Fauchet, P. M. ; Johnson, N. M.

Pub. info.:	Polysilicon films and interfaces : symposium held December 1-3, 1987, Boston, Massachusetts, U.S.A.. pp.323-328, 1988. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	106

Conference Proceedings

2. NMOS DYNAMIC SHIFT REGISTERS IN CO2 LASER-CRYSTALLIZED SILICON THIN-FILMS ON FUSED QUARTZ

Chiang, A. ; Zarzycki, M> H. ; Meuli, W. P. ; Johnson, N. M.

Pub. info.:	Comparison of thin film transistor and SOI technologies : symposium held February 1984 in Albuquerque, New Mexico, U.S.A.. pp.119-126, 1984. New York. North Holland
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	33

Conference Proceedings

3. ELECTRONIC DEEP LEVELS IN LASER-CRYSTALLIZED SILICON THIN- FILM MOS CAPACITORS ON FUSED SILICA

Johnson, N. M. ; Moyer, M. D.

Pub. info.:	Comparison of thin film transistor and SOI technologies : symposium held February 1984 in Albuquerque, New Mexico, U.S.A.. pp.101-108, 1984. New York. North Holland
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	33

Conference Proceedings

4. DEFECT STATES IN GaAs AFTER RAPID THERMAL ANNEALING

Street, R. A. ; Johnson, N. M. ; Burnham, R. D.

Pub. info.:	Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.. pp.333-338, 1985. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	46

Conference Proceedings

5. THE STRUCTURE OF THE BORON-HYDROGEN COMPLEX IN SILICON

Marwick, A. D. ; Oehrlein, G. S. ; Barrett, J. H. ; Johnson, N. M.

Pub. info.:	Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A.. pp.259-264, 1988. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	104

Conference Proceedings

6. HYDROGEN NEUTRALIZATION OF CHALCOGEN DOUBLE DONOR CENTERS IN SINGLE-CRYSTAL SILICON

Pensl, G. ; Roos, G. ; Stolz, P. ; Johnson, N. M. ; Holm, C.

Pub. info.:	Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A.. pp.241-246, 1988. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	104

Conference Proceedings

7. ELECTRONIC DEFECTS IN TRANSIENT, THERMALLY PROCESSED SEMICONDUCTORS

Johnson, N. M.

Pub. info.:	Energy beam-solid interactions and transient thermal processing/1984 : symposium held November 26-30, 1984, Boston, Massachusetts, U.S.A.. pp.265-276, 1985. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	35

Conference Proceedings

8. HYDROGEN NEUTRALIZATION OF SHALLOW-DONOR IMPURITIES IN SINGLE-CRYSTAL SILICON

Johnson, N. M. ; Herring, C.

Pub. info.:	Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A.. pp.277-280, 1988. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	104

Conference Proceedings

9. ELECTRON TRAPPING PROPERTIES OF SILICON NITRIDE DETERMINED BY AVALANCHE INJECTION

Park, Y. C. ; Jackson, W. B. ; Johnson, N. M. ; Hagstrom, S. B.

Pub. info.:	Amorphous silicon technology, 1989 : symposium held April 25-28, 1989, San Diego, California, U.S.A.. pp.551-556, 1989. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	149

10.

Conference Proceedings

10. *ELECTRONIC DEFECTS IN SILICON AFTER TRANSIENT ISOTHERMAL ANNEALING

Pensl, G. ; Schulz, M. ; Stolz, P. ; Johnson, N. M. ; Gibbons, J. F. ; Hoyt, J. L.

Pub. info.:	Energy beam-solid interactions and transient thermal processing : symposium held November 1983 in Boston, Massachusetts, U.S.A.. pp.347-358, 1984. New York. North-Holland
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	23

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