1.

Conference Proceedings
Conference Proceedings
1. THE BEHAVIOUR OF OXYGEN IN OXYGENATED N-TYPE HIGH-RESISTIVITY FLOAT-ZONE SILICON
Simoen, E. ; Claeys, C. ; Job, R. ; Ulyashin, A.G. ; Fahrner, W.R. ; Tonelli, G. ; Degryse, O. ; Clauws, P.
Pub. info.: Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology.  pp.912-924,  2002.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-2
2.

Conference Proceedings
Conference Proceedings
2. THE BEHAVIOUR OF OXYGEN IN OXYGENATED N-TYPE HIGH-RESISTIVITY FLOAT-ZONE SILICON
Simoen, E. ; Claeys, C. ; Job, R. ; Ulyashin, A.G. ; Fahrner, W.R. ; Tonelli, G. ; Degryse, O. ; Clauws, P.
Pub. info.: Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology.  pp.912-926,  2002.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-2
3.

Conference Proceedings
Conference Proceedings
3. Doping Of Oxidized Float Zone Silicon By Thermal Donors - A Low Thermal Budget Doping Method For Device Applications?
Job, R. ; Ulyashin, A.G. ; Huang, Y.L. ; Fahrner, W.R. ; Simoen, E. ; Claeys, C. ; Niedernostheide, F.-J. ; Schulze, H.-J. ; Tonelli, G.
Pub. info.: Defect and impurity engineered semiconductors and devices III : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.257-262,  2002.  Warrendale, Pa.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 719
4.

Conference Proceedings
Conference Proceedings
4. Influence of γ-radiation on short channel SOI-MOSFETs with thin SiO2films
Claeys, C. ; Simoen, E. ; Litovchenko, V.G. ; Evtukh, A. ; Efremov, A. ; Kizjak, A. ; Rassamakin, Ju.
Pub. info.: Progress in SOI structures and devices operating at extreme conditions.  pp.211-220,  2002.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 58
5.

Conference Proceedings
Conference Proceedings
5. The Influence of the Interface Trap Densities on the Extraction of the Silicon Film and Front Oxide Thickness of SOI NMOS Devices at Low Temperatures
Nicolett, A.S. ; Martino, J.A. ; Simoen, F. ; Claeys, C.
Pub. info.: Microelectronics technology and devices : SBMICRO 2002 : proceedings of the seventeenth international symposium.  pp.28-34,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-8
6.

Conference Proceedings
Conference Proceedings
6. Impact of Thermal Budget on Junction Leakage in a 0.18 and 0.13 μm CMOS Technology
Poyai, A. ; Simoen, E. ; Claeys, C. ; Rooyackers, R. ; Redolfi, A.
Pub. info.: Microelectronics technology and devices : SBMICRO 2002 : proceedings of the seventeenth international symposium.  pp.213-222,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-8
7.

Conference Proceedings
Conference Proceedings
7. Comparison Between 0.13 μm Partially-Depleted Silicon-On-Insulator Technology with Floating Body Operation at 300 K and 90 K
Pavanello, M.A. ; Martino, J.A. ; Mercha, A. ; Rafi, J.M. ; Simoen, E. ; Claeys, C. ; van Meer, H. ; De Meyer, K.
Pub. info.: Microelectronics technology and devices : SBMICRO 2002 : proceedings of the seventeenth international symposium.  pp.205-212,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-8
8.

Conference Proceedings
Conference Proceedings
8. IMPACT OF STATE-OF-THE-ART Cz SUBSTRATES ON THE CURRENT-VOLTAGE CHARACTERSTiCS OF SHALLOW p-n JUNCTIONS
Poyai, A. ; Simoen, E. ; Claeys, C. ; Huber, A. ; Graef, D. ; Gaubas, E.
Pub. info.: Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology.  pp.694-706,  2002.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-2
9.

Conference Proceedings
Conference Proceedings
9. Diode Analysis of Deep Submicron CMOS P-Well Implantation Damage
Poyai, A. ; Simoen, E. ; Claeys, C. ; Rooyackers, R.
Pub. info.: High purity silicon VII : proceedings of the international symposium.  pp.266-277,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-20
10.

Conference Proceedings
Conference Proceedings
10. Influence of the Back Gate Voltage on the Total Series Resistance of Fully Depleted SOI MOSFETS at 300 K and 77 K
Nicolett, A.S. ; Martino, J.A. ; Simoen, E. ; Claeys, C.
Pub. info.: Microelectronics technology and devices : SBMICRO 2002 : proceedings of the seventeenth international symposium.  pp.430-436,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-8