1.

Conference Proceedings

Conference Proceedings
Mou,X. ; You,Y. ; Zhuo,Y. ; Yang,Y. ; Xu,M.
Pub. info.: Metrology, inspection, and process control for microlithography XII : 23-25 February 1998, San Clara, California.  pp.482-487,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3332
2.

Conference Proceedings

Conference Proceedings
Goo,G.-I. ; Yang,Y. ; Au,W.W.L. ; Couchman,L.S.
Pub. info.: Detection and remediation technologies for mines and minelike targets III : 13-17 April 1998, Orlando, Florida.  Part 1  pp.218-231,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3392
3.

Conference Proceedings

Conference Proceedings
Wang,Y. ; Yang,Y. ; Guo,Y. ; Gan,R. ; Wang,J. ; Sun,Y. ; Chen,G.
Pub. info.: Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China.  pp.104-107,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3175
4.

Conference Proceedings

Conference Proceedings
Yu,D. ; Tao,Y. ; Yin,X. ; Chen,L. ; Yang,Y. ; Li,H. ; Wang,R.
Pub. info.: High-power lasers : solid state, gas, excimer, and other advanced lasers II : 16-18 September 1998, Beijing, China.  pp.144-151,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3549
5.

Conference Proceedings

Conference Proceedings
Yang,W. ; Yang,Y. ; Yang,T. ; Deng,W.
Pub. info.: Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China.  pp.424-429,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3558
6.

Conference Proceedings

Conference Proceedings
Shen,B. ; Tian,C. ; Tang,M. ; Yang,Y. ; Cheng,J. ; Shen,L.
Pub. info.: Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China.  pp.31-38,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3558
7.

Conference Proceedings

Conference Proceedings
Wang,C. ; Fei,H. ; Yang,Y. ; Wei,Z. ; Xia,J. ; Qiu,Y. ; Yang,Q. ; Sun,G. ; Chen,Y. ; Hao,E.
Pub. info.: Photorefractive materials : phenomena and related applications, 16-17 September 1998 Beijing, China.  pp.173-178,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3554
8.

Conference Proceedings

Conference Proceedings
Wang,X. ; Yang,Y. ; Xie,J. ; Wang,W. ; Ren,C.
Pub. info.: Micromachining and microfabrication process technology IV : 21-22 September, 1998, Santa Clara, California.  pp.169-173,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3511
9.

Conference Proceedings

Conference Proceedings
Yang,W. ; Yang,Y. ; Yang,T. ; Tian,Z.
Pub. info.: Opto-contact : workshop on technology transfers, start-up opportunities and strategic alliances : 13-14 July, 1998, Québec, Canada.  pp.82-85,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3414
10.

Conference Proceedings

Conference Proceedings
Li,Q. ; Yang,Y. ; Chung,W.
Pub. info.: Electronic imaging and multimedia systems II : 18-19 September, 1998, Beijing, China.  pp.69-78,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3561