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24 results

Conference Proceedings

1. In-the-loop training algorithm for neural network implementation with digital weights

Yang,J. ; Jullien,G.A. ; Ahmadi,M. ; Miller,W.C.

Pub. info.:	Intelligent systems in design and manufacturing. pp.104-109, 1998. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3517

Conference Proceedings

2. Application of plasma-polymerized methylsilane for 0.18-ｦﾌm photolithography

Monget,C. ; Lee,C.Y. ; Joubert,O.P. ; Amblard,G.R. ; Weidman,T.W. ; Sugiarto,D. ; Yang,J. ; Cormont,F. ; Inglebert,R.L.

Pub. info.:	Advances in resist technology and processing XV : 23-25 February 1998, Santa Clara, California. Part 1 pp.366-375, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3333

Conference Proceedings

3. 5x-density magneto-optical disk media tester

Yang,J. ; Pan,L. ; Lu,Z. ; Lu,Y. ; Zeng,H. ; Chen,J. ; Ma,L. ; Xu,D.

Pub. info.:	Optical storage technology : 16-18 September, 1998, Beijing, China. pp.121-126, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3562

Conference Proceedings

4. MBE growth of HgCdTe for infrared focal plane arrays

He,L. ; Yang,J. ; Wang,S. ; Yu,M. ; Wu,Y. ; Qiao,Y. ; Chen,X. ; Fang,W. ; Zhang,Q. ; Gui,Y. ; Chu,J.

Pub. info.:	Detectors, focal plane arrays, and imaging devices II : 18-19 September 1998, Beijing, China. pp.13-22, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3553

Conference Proceedings

5. Carrier transport mechanisms in organic electroluminescent devices

Shen,J. ; Xu,J.-H. ; Yang,J. ; So,F. ; Lee,H.-C.

Pub. info.:	Polymer photonic devices : 28-30 January 1998 San Jose, California. pp.248-256, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3281

Conference Proceedings

6. LiNbO3 rhomboprism machining

Zhang,Y. ; Yang,J. ; Feng,J. ; Li,Y.

Pub. info.:	Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China. pp.214-218, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3557

Conference Proceedings

7. BaF2 crystal machining

Zhang,Y. ; Yang,J. ; Feng,J. ; Li,Y.

Pub. info.:	Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China. pp.210-213, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3557

Conference Proceedings

8. Theoretical analysis of friction moment between press head and press disk in lapping

Yang,J. ; Ren,C. ; Wang,C. ; Wang,L.

Pub. info.:	Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China. pp.225-228, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3557

Conference Proceedings

9. Feasibility of a CVD-resist-based lithography process at 193-nm wavelength

Lee,C.Y. ; Das,S. ; Yang,J. ; Weidman,T.W. ; Sugiarto,D. ; Nault,M. ; Mui,D. ; Osborne,Z.A.

Pub. info.:	Advances in resist technology and processing XV : 23-25 February 1998, Santa Clara, California. Part 1 pp.625-633, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3333

10.

Conference Proceedings

10. New kind of spectral analysis instrument for measuring time-resolved spectrum of single-pulse light

Yang,J. ; Yang,C. ; Ha,Y. ; Chen,X. ; Jin,L. ; Tan,H. ; Hu,S. ; Wang,X. ; Peng,Q.

Pub. info.:	Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.622-625, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3558

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