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20 results

Conference Proceedings

1. Preparation and characterization of the quantum dot quantum well system CdS/CuS/CdS

Chen,H. ; Huang,X. ; Huang,H. ; Xu,L. ; Xu,J. ; Chen,K. ; Feng,D.

Pub. info.:	Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.32-36, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3175

Conference Proceedings

2. Multidomain STN LCDs

Guo,J. ; Wu,S.L. ; Ma,Z. ; Huang,X.

Pub. info.:	Liquid crystals : physics, technology, and applications : 3-8 March 1997, Zakopane, Poland. pp.511-514, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3318

Conference Proceedings

3. New color filter with negative birefringence

Shao,X. ; Yuan,J. ; Wu,Y. ; Ma,Z. ; Li,B. ; He,T. ; Huang,X.

Pub. info.:	Liquid crystals : physics, technology, and applications : 3-8 March 1997, Zakopane, Poland. pp.471-474, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3318

Conference Proceedings

4. Machine accuracy for rapid prototyping of quality components

Gu,P. ; Yan,M. ; Huang,X. ; Zhang,X.

Pub. info.:	Intelligent systems in design and manufacturing. pp.91-101, 1998. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3517

Conference Proceedings

5. Optical and electrical properties of a-Si1-xCx:H and ｦﾌc-Si1-xCx:H films perpared by using a methane and xylene source

Ma,T. ; Xu,J. ; Wang,L. ; Huang,X. ; Du,J. ; Li,W. ; Chen,K.

Pub. info.:	Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.446-450, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3175

Conference Proceedings

6. Visible electroluminescence from pulsed-laser-annealed a-Si:H/a-SiNx:H superlattices on silicon wafer

Wang,M. ; Huang,X. ; Li,W. ; Xu,J. ; Chen,K. ; Wang,Q.

Pub. info.:	Integrated optic devices II : 28-30 January 1998, San Jose, California. pp.340-345, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3278

Conference Proceedings

7. Progress in liquid crystal material and display studies in China

Tian,Y. ; Guo,J. ; Huang,X.

Pub. info.:	Liquid crystals : physics, technology, and applications : 3-8 March 1997, Zakopane, Poland. pp.480-485, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3318

Conference Proceedings

8. Preparation of superconducting YBa2Cu3O7-x films on metallic substrates by pulsed-laser deposition

Wang,Y. ; Su,B. ; Huang,X. ; Wang,Q.L. ; An,C.W. ; Fan,Y.C. ; Lu,D.S.

Pub. info.:	Laser processing of materials and industrial applications II : 16-19 September 1998, Beijing, China. pp.76-79, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3550

Conference Proceedings

9. Automonitoring the status of a mobile microsphere

Yin,H. ; Shi,B. ; Li,C. ; Huang,X. ; Wang,J.

Pub. info.:	Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.18-22, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3558

10.

Conference Proceedings

10. Formation of the patterned nanocrystalline Si by pulsed-laser interference crystallization of a-Si: H thin films

Wang,M. ; Chen,K. ; Jiang,M. ; Liu,X. ; Wu,Z. ; Li,W. ; Huang,X.

Pub. info.:	Laser processing of materials and industrial applications II : 16-19 September 1998, Beijing, China. pp.80-84, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3550

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