Optical information processing technology : 16-18 October 2002, Shanghai, China. pp.190-197, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Shu, X.W. ; Sugden, K. ; Zhao, D.H. ; Floreani, F. ; Zhang, L. ; Bennion, I.
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Advanced sensor systems and applications : 15-18 October 2002, SHanghai, China. pp.373-376, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Design, process integration, and characterization for microelectronics : 6-7 March 2002, Santa Clara, USA. pp.336-344, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Hu, S. ; Krylov, S.N. ; Zhang, L. ; Zhang, Z. ; Lee, R.W. ; Dovichi, N.J.
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Clinical diagnostic systems : technologies and instrumentation : 22-24 January 2002, San Jose, USA. pp.98-105, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Ultrafast phenomena in semiconductors VI : 21, 24-25 January, 2002, San Jose, USA. pp.228-230, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001. pp.667-670, 2002. Zuerich, Switzerland. Trans Tech Publications
Smart materials II : 16-18 December 2002, Melbourne, Australia. pp.30-37, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of IMAC-XX : a Conference on Structural Dynamics, February 4-7, 2002, The Westin Los Angeles Airport, Los Angeles, California. Volume I pp.542-547, 2002. Bethel, CT. SPIE-The International Society for Optical Engineering
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Tamura, Y. ; Zhang, L. ; Yoshida, A. ; Cho, K. ; Nakata, S. ; Naito, S.
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Proceedings of IMAC-XX : a Conference on Structural Dynamics, February 4-7, 2002, The Westin Los Angeles Airport, Los Angeles, California. Volume I pp.141-146, 2002. Bethel, CT. SPIE-The International Society for Optical Engineering
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Eybert, L. ; Wulff, M. ; Reichenbach, W. ; Plech, A. ; Schotte, F. ; Gagliardini, E. ; Zhang, L. ; Hignette, O. ; Rommeveaux, A. ; Freund, A.K.
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X-ray mirrors, crystals, and multilayers II : 10-11 July 2002, Seattle, Washington, USA. pp.246-257, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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