1.

Conference Proceedings

Conference Proceedings
Jing, H. ; Chen, X. ; Tao, Y. ; Zhu, B. ; Jin, F.
Pub. info.: Two- and three-dimensional methods for inspection and metrology III : 24-26 October, 2005, Boston, Massachusetts, USA.  pp.60000K-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6000
2.

Conference Proceedings

Conference Proceedings
Wang,J. ; Walton, T. D. ; Li, M. J. ; Nolan, A. D. ; Berkey, E. G. ; Koh, J. ; Chen, X. ; Zenteno, A. L.
Pub. info.: ICO20 : lasers and laser technologies : 21-26 August, 2005, Changchun, China.  pp.602802-602802,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6028
3.

Conference Proceedings

Conference Proceedings
Deng, L. ; Chen, Y. ; Chen, X.
Pub. info.: ICO20 : lasers and laser technologies : 21-26 August, 2005, Changchun, China.  pp.602822-602822,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6028
4.

Conference Proceedings

Conference Proceedings
Zeng, X. ; Chen, X. ; Nakao, Z. ; Alphen, D. van
Pub. info.: Applications of neural networks and machine learning in image processing IX : 19-20 January 2005, San Jose, California, USA.  pp.99-105,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5673
5.

Conference Proceedings

Conference Proceedings
Zhao, S. ; Wang, Z. ; Dong, X. ; Chen, X.
Pub. info.: Image processing and pattern recognition in remote sensing II :8-9 November 2004, Honolulu, Hawaii, USA.  pp.99-106,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5657
6.

Conference Proceedings

Conference Proceedings
Wang, Z. ; Chen, X. ; Zhao, S. ; Luo, Y.
Pub. info.: Image processing and pattern recognition in remote sensing II :8-9 November 2004, Honolulu, Hawaii, USA.  pp.74-81,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5657
7.

Conference Proceedings

Conference Proceedings
Luo, H. ; Ye, H. ; Ke, Y. ; Pan, J. ; Gong, J. ; Chen, X.
Pub. info.: Image processing and pattern recognition in remote sensing II :8-9 November 2004, Honolulu, Hawaii, USA.  pp.90-98,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5657
8.

Conference Proceedings

Conference Proceedings
Jiang, Y. ; Jiang, W. ; Chen, X. ; Gu, L. ; Howley, B. ; Chen, R.T.
Pub. info.: Photonic crystal materials and devices III : 24-27 January, 2005, San Jose, California, USA.  pp.166-175,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5733
9.

Conference Proceedings

Conference Proceedings
Chen, X. ; Li, L. M. ; Yang, E. ; Huang, X. F.
Pub. info.: Residual stresses VII : ICRS 7 : proceedings of the 7th International Conference on Residual Stresses, ICRS-7 Xi'an, China, 14-17, June, 2004.  pp.317-321,  2005.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 490-491
10.

Conference Proceedings

Conference Proceedings
Chen, X. ; Qiu, H. ; Qian, H. ; Wu, P. ; Wang, F. ; Pan, L. ; Tian, Y.
Pub. info.: PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, China.  pp.3725-3728,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 475-479(5)