Two- and three-dimensional methods for inspection and metrology III : 24-26 October, 2005, Boston, Massachusetts, USA. pp.60000K-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Wang,J. ; Walton, T. D. ; Li, M. J. ; Nolan, A. D. ; Berkey, E. G. ; Koh, J. ; Chen, X. ; Zenteno, A. L.
Pub. info.:
ICO20 : lasers and laser technologies : 21-26 August, 2005, Changchun, China. pp.602802-602802, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
ICO20 : lasers and laser technologies : 21-26 August, 2005, Changchun, China. pp.602822-602822, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Applications of neural networks and machine learning in image processing IX : 19-20 January 2005, San Jose, California, USA. pp.99-105, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Image processing and pattern recognition in remote sensing II :8-9 November 2004, Honolulu, Hawaii, USA. pp.99-106, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Image processing and pattern recognition in remote sensing II :8-9 November 2004, Honolulu, Hawaii, USA. pp.74-81, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Luo, H. ; Ye, H. ; Ke, Y. ; Pan, J. ; Gong, J. ; Chen, X.
Pub. info.:
Image processing and pattern recognition in remote sensing II :8-9 November 2004, Honolulu, Hawaii, USA. pp.90-98, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Jiang, Y. ; Jiang, W. ; Chen, X. ; Gu, L. ; Howley, B. ; Chen, R.T.
Pub. info.:
Photonic crystal materials and devices III : 24-27 January, 2005, San Jose, California, USA. pp.166-175, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Residual stresses VII : ICRS 7 : proceedings of the 7th International Conference on Residual Stresses, ICRS-7 Xi'an, China, 14-17, June, 2004. pp.317-321, 2005. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Chen, X. ; Qiu, H. ; Qian, H. ; Wu, P. ; Wang, F. ; Pan, L. ; Tian, Y.
Pub. info.:
PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, China. pp.3725-3728, 2005. Uetikon-Zuerich. Trans Tech Publications