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13 results

Conference Proceedings

1. Noise as a Spectroscopic Tool for Semiconductor Characterization

Clacys, C. ; Simoen, E.

Pub. info.:	Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices. pp.324-341, 1997. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	97-12

Conference Proceedings

2. Degradation and recovery of alpha ray irradiated MOSFETs on SIMOX

Ohyama, H. ; Simoen, E. ; Claeys, C. ; Takami, Y. ; Kawamura, K. ; Hakata, T. ; Sunaga, H. ; Ogita, Y.

Pub. info.:	Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices. pp.289-294, 1997. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	97-23

Conference Proceedings

3. Freeze-out Effects on the Characteristics of Deep Submicron Si MOSFETs in the 77 to 300 K Range

Croon, J. ; Biesemans, S. ; Kubicek, S. ; Simoen, E. ; De Meyer, K. ; Claeys, C.

Pub. info.:	Proceedings of the fourth Symposium on Low Temperature Electronics and High Temperature Superconductivity. pp.187-198, 1997. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	97-2

Conference Proceedings

4. Impact Ionization Related Phenomena in Si MOSFETs Operated at Cryogenic Temperatures

Simoen, E. ; Claeys, C.

Pub. info.:	Proceedings of the fourth Symposium on Low Temperature Electronics and High Temperature Superconductivity. pp.117-139, 1997. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	97-2

Conference Proceedings

5. Simple Method to Extract the length Dependent Mobility Degradation Factor at 77 K

Nicolett, A.S. ; Martino, J.A. ; Simoen, E. ; Claeys, C.

Pub. info.:	Proceedings of the fourth Symposium on Low Temperature Electronics and High Temperature Superconductivity. pp.159-170, 1997. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	97-2

Conference Proceedings

6. Interface defects of the new type detected by the noise method in SOI and SOS MOSFETs

Lukyanchikova, N. ; Petrichuk, M. ; Garbar, N. ; Simoen, E. ; Claeys, C.

Pub. info.:	Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices. pp.203-214, 1997. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	97-23

Conference Proceedings

7. Optimised diode analysis of electrical silicon substrate properties

Czerwinski, A. ; Tomaszewski, D. ; Gibki, J. ; Bakowski, A. ; Klima, K. ; Katcki, J. ; Simoen, E. ; Claeys, C.

Pub. info.:	Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II. pp.218-227, 1997. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	97-22

Conference Proceedings

8. Proton irradiation induced lattice defects in Si diodes and their effects on device performance

Ohyama, H. ; Simoen, E. ; Claeys, C. ; Vanhellemont, J. ; Takami, Y. ; Hayama, T. ; Sunaga, H. ; Kobayashi, K.

Pub. info.:	Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II. pp.143-152, 1997. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	97-22

Conference Proceedings

9. Impact of processing parameters on leakage current and defect behaviour of N+P silicon junction diodes

Gramenova, E. ; Jansen, Ph. ; Simoen, E. ; Vanhellemont, J. ; Dupas, L. ; Deferm, L.

Pub. info.:	Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II. pp.228-242, 1997. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	97-22

10.

Conference Proceedings

10. Radiation Source Dependence of Degradation in MOSFETS on SIMOX Substrate

Hakata, T. ; Ohyama, H. ; Simoen, E. ; Claeys, C. ; Takami, Y. ; Kawamura, K. ; Miyahara, K. ; Hososhima, M.

Pub. info.:	Semiconductors for room-temperature radiation detector applications II : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.. pp.387-, 1997. Pittsburgh, PA. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	487

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