Eco-materials processing & design VII : proceedings of the Conference of the 7th International Symposium on Eco-materials Processing & Design, January 8-11 2006, Chengdu, China. pp.90-93, 2006. Uetikon-Zuerich. Trans Tech Publications
Geoinformatics 2006 : Remotely sensed data and information : 28-29 October 2006, Wuhan, China. pp.641909-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Gao, W. ; Yang, K. ; Liu, H. ; Feng, J. ; Hou, J. ; Liu, S.
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Design, fabrication, and characterization of photonic devices : 27-30 November 2001, Singapore. pp.385-390, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Xu, R. ; Zhou, Q, ; Chang, C. ; Yang, K. ; Chen, Z.
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Photonic systems and applications : 27-30 November 2001, Singapore. pp.17-21, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Xu, R. ; Zhou, Q. ; Chang, C. ; Yang, K. ; Chen, Z.
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Photonic systems and applications : 27-30 November 2001, Singapore. pp.268-271, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Ocean remote sensing and applications : 24-26 October 2002, Hangzhou, China. pp.513-520, 2003. Bellingham, Wash. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Liu, Q. ; Yang, K. ; Liu, J. ; Tan, D. ; Gao, Y. ; Yu, L.
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Optical design and testing II : 8-12 November 2004, Beijing, China. pp.937-940, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Gao, Q. ; Li, Y. ; Wan, Y. ; Lin, E. ; Sheng, W. ; Yang, K.
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Remote sensing and modeling of ecosystems for sustainability III : 14-16 August 2006, San Diego, California, USA. pp.62982J-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Bruno, F. F. ; Sidhartha, J. S. ; Samuelson, L. ; Nagarajan, R. ; Yang, K. ; Kumar, J. ; Tripathy, S.
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ANTEC 2000 Conference proceedings, May 7-11, 2000, Orlando, Florida. pp.2336-2340, 2000. Brookfield Center, CT. Society of Plastics Engineers, Inc. (SPE)
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Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Advanced signal processing algorithms, architectures, and implementations XIII : 6-8 August, 2003, San Diego, California, USA. pp.254-265, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Eco-materials processing & design VII : proceedings of the Conference of the 7th International Symposium on Eco-materials Processing & Design, January 8-11 2006, Chengdu, China. pp.434-437, 2006. Uetikon-Zuerich. Trans Tech Publications
Bruno, F. F. ; Sidhartha, J. S. ; Samuelson, L. ; Nagarajan, R. ; Yang, K. ; Kumar, J. ; Tripathy, S.
Pub. info.:
ANTEC 2000 Conference proceedings, May 7-11, 2000, Orlando, Florida. pp.2336-2340, 2000. Brookfield Center, CT. Society of Plastics Engineers, Inc. (SPE)
Title of ser.:
Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
APOC 2001: Asia-Pacific Optical and Wireless Communications : Optoelectronics, Materials, and Dvices for Communications : 13-15 November 2001, Beijing, Chaina. pp.309-313, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Deng, X. ; Ye, H. ; Tan, D. ; Zhang, X. ; Yang, K. ; Liu, Q ; Lei, X. ; Yu, L. ; Xia, M. ; Li, W.
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Holography, diffractive optics, and applications II : 8-11 November 2004, Beijing, China. pp.728-733, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Holography, diffractive optics, and applications II : 8-11 November 2004, Beijing, China. pp.856-866, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, China. pp.2395-2398, 2005. Uetikon-Zuerich. Trans Tech Publications
PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, Chin. pp.677-680, 2005. Uetikon-Zuerich. Trans Tech Publications
Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001). VOL-1 pp.12-20, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment. pp.61501U-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment. pp.615021-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment. pp.61502L-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Bunday, B. ; Lipscomb, W. ; Allgair, J. ; Yang, K. ; Koshihara, S. ; Morokuma, H. ; Page, L. ; Danilevsky, A.
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Metrology, Inspection, and Process Control for Microlithography XX. pp.61521B-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Yang, H. ; Park, C. ; Hong, J. ; Jeong, G. ; Cho, B. ; Choi, J. ; Kang, C. ; Yang, K. ; Kang, E. ; Ji, S. ; Yim, D. ; Song, Y.
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Metrology, Inspection, and Process Control for Microlithography XVIII. pp.437-443, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering