Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.339-343, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Display devices and systems II : 16-17 September 1998, Beijing, China. pp.227-232, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California. pp.9-14, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.105-109, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Multispectral imaging for terrestrial applications : 8-9 August 1996, Denver, Colorado. pp.205-209, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Design, fabrication, and characterization of photonic devices : 30 November-3 December 1999, Singapore. pp.594-601, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.210-213, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical online industrial process monitoring : 22 September 1999, Boston, Massachusetts. pp.40-52, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Astronomical Interferometry : 20-24 March 1998, Kona, Hawaii. Part 1 pp.229-236, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Infrared Detectors and Focal Plane Arrays V : 14-17 April 1998, Orlando, Florida. pp.618-622, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering