1.

Conference Proceedings

Conference Proceedings
Wang,Z. ; Chen,H. ; Zuo,T.
Pub. info.: Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China.  pp.37-41,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4221
2.

Conference Proceedings

Conference Proceedings
Zuo,T. ; Chen,T. ; Li,C.
Pub. info.: Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China.  pp.40-44,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4223
3.

Conference Proceedings

Conference Proceedings
Li,Q. ; Lei,H. ; Zuo,T.
Pub. info.: Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China.  pp.45-49,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4223
4.

Conference Proceedings

Conference Proceedings
Wan,Y. ; Zuo,T. ; Jiang,Y.
Pub. info.: Process Control and Inspection for Industry.  pp.361-365,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4222
5.

Conference Proceedings

Conference Proceedings
Zuo,T. ; Chen,J. ; Xiao,R. ; Bao,Y.
Pub. info.: Process Control and Inspection for Industry.  pp.1-7,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4222