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Conference Proceedings

1. MICROROUGHNESS ANALYSIS OF SILICON WAFERS USING ULTRAVIOLET RAMAN MICROSCOPY

Wang, J. ; Tu, H. ; Liu, B. ; Zhou, Q. ; Zhu, W.

Pub. info.:	Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology. pp.906-911, 2002. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2002-2

Conference Proceedings

2. MICROROUGHNESS ANALYSIS OF SILICON WAFERS USING ULTRAVIOLET RAMAN MICROSCOPY

Wang, J. ; Tu, H. ; Liu, B. ; Zhou, Q. ; Zhu, W.

Pub. info.:	Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology. pp.906-911, 2002. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2002-2

Conference Proceedings

3. The Effect of Sheath Materials on the Superconductivity of MgB2

Zhu, W. ; Watson, D.R. ; Cave, J.R.

Pub. info.:	Materials for high-temperature superconductor technologies : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A.. pp.139-144, 2002. Warrendale, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	689