Medical imaging 1998, Image processing : 23-26 February 1998, San Diego, California. Part 2 pp.1547-1555, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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International Workshop on New Approaches to High-Tech Materials, Nondestructive Testing and Computer Simulations in Materials Science and Engineering : 9-13 June 1997, St. Petersburg, Russia. pp.98-105, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.585-590, 1995. Zurich, Switzerland. Trans Tech Publications
Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.2 pp.707-714, 1994. Zurich, Switzerland. Trans Tech Publications
Fiber optic sensors V : 6-7 November 1996, Beijing, China. pp.421-425, 1996. Bellingham, Wash. USA. SPIE-The International Society for Optical Engineering
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Detectors, focal plane arrays, and applications : 4-5 November 1996, Beijing, China. pp.211-215, 1996. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Silicon-Based Monolithic and Hybrid Optoelectronic Devices. pp.144-151, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering