1.

Conference Proceedings
Conference Proceedings
1. In-situ single-wavelength ellipsometer for a vacuum chamber
Chegal,W. ; Ye,S. ; Cho,H.M. ; Lee,Y.W. ; Kim,S.H. ; Kwak,Y.K.
Pub. info.: Optical engineering for sensing and nanotechnology (ICOSN 2001) : 6-8 June 2001, Yokohama, Japan.  pp.15-18,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4416
2.

Conference Proceedings
Conference Proceedings
2. Optoelectronic inspection method for IC shell blanks
Sun,C. ; Shi,H. ; Xue,X. ; Ye,S.
Pub. info.: Process Control and Inspection for Industry.  pp.129-132,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4222
3.

Conference Proceedings
Conference Proceedings
3. Ways-free registration method and its application in 3D data fusion
Kou,X. ; Wang,Z. ; Chen,M. ; Ye,S.
Pub. info.: Visualization and Optimization Techniques.  pp.280-285,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4553
4.

Conference Proceedings
Conference Proceedings
4. Grid-code-based fast matching method in active binocular vision
Chen,M. ; Wang,Z. ; Kou,X. ; Ye,S.
Pub. info.: Image Matching and Analysis.  pp.253-258,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4552