1.

Conference Proceedings
Conference Proceedings
1. Research on filter processing of LIDAR data [6419-62]
Yu, J. ; Zhang, G. ; Li, P. ; Qin, K. ; Yang, H.
Pub. info.: Geoinformatics 2006 : Remotely sensed data and information : 28-29 October 2006, Wuhan, China.  pp.64191Q-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6419
2.

Conference Proceedings
Conference Proceedings
2. Research on key technologies for data-interoperability-based metadata, data compression and encryption, and their application [6421-12]
Yu, X. ; Shao, Q. ; Zhu, Y. ; Deng, Y. ; Yang, H.
Pub. info.: Geoinformatics 2006 : Geospatial information technology : 28-29 October 2006, Wuhan, China.  pp.64210D-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6421
3.

Conference Proceedings
Conference Proceedings
3. Study of laser scattering effect on bubbles in the ocean [6150-135]
Li, X. ; Yang, H. ; Wu, L. ; Song, Y.
Pub. info.: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment.  pp.615054-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6150
4.

Conference Proceedings
Conference Proceedings
4. All-reflective zoom systems for infrared optics (Invited Paper) [6342-102]
Chang, J. ; Wang, Y. ; Zhang, T. ; Talha, M. M. ; Weng, Z. ; Yang, H.
Pub. info.: International Optical Design Conference 2006.  pp.63421Q-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6342
5.

Conference Proceedings
Conference Proceedings
5. High NA polarized light lithography for O.29kl process [6154-15]
Park, C. ; Lee, J. ; Yang, K. ; Tseng, S. ; Min, Y.-H ; Yang, H. ; Yim, D. ; Kim, J.
Pub. info.: Optical Microlithography XIX.  pp.61540F-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6154
6.

Conference Proceedings
Conference Proceedings
6. A curvature sensor using white-light scanning interferometry [6292-48]
Kim, B. ; Kim, S. ; Kwon, Y. ; Lee, Y. ; Yang, H. ; Rhee, H.
Pub. info.: Interferometry XIII: Techniques and Analysis.  pp.629219-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6292
7.

Conference Proceedings
Conference Proceedings
7. New OPC verification method using die-to-database inspection [6152-119]
Yang, H. ; Choi, J. ; Cho, B ; Hong, J. ; Song, J. ; Yim, D. ; Kim, J. ; Yamamoto. M.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XX.  pp.615232-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6152
8.

Conference Proceedings
Conference Proceedings
8. Characterizing optical proximity effect difference among exposure tools [6152-103]
Hong, J. ; Lee, J. ; Kang, E. ; Yang, H. ; Yim, D. ; Kim, J.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XX.  pp.61522N-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6152
9.

Conference Proceedings
Conference Proceedings
9. Residual layer-free detachment-based nanolithography [6151-158]
Kim, J. K. ; Park, J. W. ; Yang, H. ; Choi, M. ; Choi, J. H. ; Suh, K. Y.
Pub. info.: Emerging Lithographic Technologies X.  pp.61512O-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6151
10.

Conference Proceedings
Conference Proceedings
10. Electrical and optical performance of InAs/GaSb superlattice LWIR detectors (Invited Paper) [6127-32]
Field, M. ; Sullivan, G. J. ; Ikhlassi A ; Grein, C. ; Flatte, M. E. ; Yang, H. ; Zhong, M. ; Weimer, M.
Pub. info.: Quantum Sensing and Nanophotonic Devices III.  pp.61270V-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6127