C. Lim ; Y. Kim ; A. Hou ; J. Gutt ; S. Marcus ; C. Pomarede ; E. Shero ; H. de Waard ; C. Werkhoven ; L. Chen ; J. Tamim ; N. Chaudhary ; G. Bersuker ; J. Barnett ; C. Young ; P. Zeitzoff ; G. A. Brown ; M. Gardner ; R. W. Murto ; H. R. Huff
Pub. info.:
Physicas and technology of high-k gate dielectrics : proceedings of the International Symposium on High Dielectric Constant Materials : Materials Science, Processing, and Reliability, and Manufacturing Issues. pp.83-92, 2002. Pennington, NJ. Electrochemical Society
H. Iwai ; S. Ohmi ; S. Akama ; C. Ohshima ; I. Kashiwagi ; A. Kikuchi ; J. Taguchi ; H. Yamamoto ; I. Ueda ; A. Kuriyama ; J. Tonotani ; Y. Kim ; Y. Yoshihara ; H. Ishiwara
Pub. info.:
Physicas and technology of high-k gate dielectrics : proceedings of the International Symposium on High Dielectric Constant Materials : Materials Science, Processing, and Reliability, and Manufacturing Issues. pp.27-40, 2002. Pennington, NJ. Electrochemical Society
J. C. Lee ; R. Choi ; K. Onishi ; N. Cho ; C. Kang ; Y. Kim ; S. Krishnan
Pub. info.:
Physicas and technology of high-k gate dielectrics : proceedings of the International Symposium on High Dielectric Constant Materials : Materials Science, Processing, and Reliability, and Manufacturing Issues. pp.171-178, 2002. Pennington, NJ. Electrochemical Society
P.-S. Lam ; Y. J. Chao ; X.-K. Zhu ; Y. Kim ; R. L. Sindelar
Pub. info.:
Computational weld mechanics, constraint, and weld fracture : presented at the 2002 ASME Pressure Vessels and Piping Conference, Vancouver, British Columbia, Canada, August 5-9, 2002. pp.133-142, 2002. New York, N.Y.. American Society of Mechanical Engineers
Title of ser.:
Proceedings of the ASME Pressure Vessels and Piping Division