Color imaging : device-independent color, color hardcopy, and graphic arts IV : 26-29 January 1999, San Jose, California. pp.320-327, 1998. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Visual communications and image processing '97 : 12-14 February 1997, San Jose, California. Part1 pp.13-24, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Applications of digital image processing XXII : 20-23 July 1999, Denver, Colorado. pp.792-800, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Color imaging : device-independent color, color hard copy, and graphic arts II : 10-14 February 1997, San Jose, California. pp.89-100, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Visual communications and image processing '97 : 12-14 February 1997, San Jose, California. Part2 pp.822-833, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Applications of digital image processing XIX : 7-9 August 1996, Denver, Colorado. pp.388-399, 1996. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Applications of digital image processing XIX : 7-9 August 1996, Denver, Colorado. pp.332-343, 1996. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Applications of digital image processing XX : 30 July-1 August 1997, San Diego, CA. pp.271-278, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering