Porkel, D. ; Fottinger, H. ; Iwatschenko-Borho, M. ; Meyer, F. ; Witthuhn, W. ; Wolf, H.
Pub. info.:
Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.. pp.481-486, 1985. Pittsburgh, Pa.. Materials Research Society
Witthuhn, W. ; De, U. ; Engel, W. ; Hoth, S. ; Keitel, R. ; Klinger, W. ; Seebock, R.
Pub. info.:
Nuclear and electron resonance spectroscopies applied to materials science : proceedings of the Materials Research Society Annual Meeting, November 1980, Copley Plaza Hotel, Boston, Massachusetts, U.S.A.. pp.397-402, 1981. New York, N.Y.. North Holland
Keitel, R. ; Engel, W. ; Hoth, S. ; Klinger, W. ; Seebock, R. ; Witthuhn, W.
Pub. info.:
Nuclear and electron resonance spectroscopies applied to materials science : proceedings of the Materials Research Society Annual Meeting, November 1980, Copley Plaza Hotel, Boston, Massachusetts, U.S.A.. pp.443-448, 1981. New York, N.Y.. North Holland