1.

Conference Proceedings

Conference Proceedings
Porkel, D. ; Fottinger, H. ; Iwatschenko-Borho, M. ; Meyer, F. ; Witthuhn, W. ; Wolf, H.
Pub. info.: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.481-486,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 46
2.

Conference Proceedings

Conference Proceedings
Witthuhn, W. ; De, U. ; Engel, W. ; Hoth, S. ; Keitel, R. ; Klinger, W. ; Seebock, R.
Pub. info.: Nuclear and electron resonance spectroscopies applied to materials science : proceedings of the Materials Research Society Annual Meeting, November 1980, Copley Plaza Hotel, Boston, Massachusetts, U.S.A..  pp.397-402,  1981.  New York, N.Y..  North Holland
Title of ser.: Materials Research Society symposia proceedings
Ser. no.: 3
3.

Conference Proceedings

Conference Proceedings
Keitel, R. ; Engel, W. ; Hoth, S. ; Klinger, W. ; Seebock, R. ; Witthuhn, W.
Pub. info.: Nuclear and electron resonance spectroscopies applied to materials science : proceedings of the Materials Research Society Annual Meeting, November 1980, Copley Plaza Hotel, Boston, Massachusetts, U.S.A..  pp.443-448,  1981.  New York, N.Y..  North Holland
Title of ser.: Materials Research Society symposia proceedings
Ser. no.: 3