1.

Conference Proceedings
Conference Proceedings
1. In Situ Electromigration Damage of Al Interconnect Lines and the Influence of Grain Orientation
Buerke, A. ; Wendrock, H. ; Kotter, T. ; Menzel, S. ; Wetzig, K. ; Glasow, A. von
Pub. info.: Materials reliability in microelectronics IX : symposium held April 6-8, 1999, San Francisco, California, U.S.A..  pp.109-,  1999.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 563
2.

Conference Proceedings
Conference Proceedings
2. X-ray Optical Properties of C/C-Multilayers Prepared by Pulsed Laser Deposition (PLD)
Dietsch, R. ; Holz, T. ; Mai, H. ; Hopfe, S. ; Scholz, R. ; Wehner, B. ; Wendrock, H.
Pub. info.: Structure and properties of multilayered thin films : symposium held April 17-19, 1995, San Francisco, California, U.S.A..  pp.345-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 382